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In Situ High Temperature Atomic Resolution Transmission Electron Microscopy of 2D Nanomaterials

Published online by Cambridge University Press:  27 August 2014

Ashley L. Gibb ,
Nasim Alem ,
Jian-Hao Chen ,
Jim Ciston  and
Alex Zettl
Ashley L. Gibb
Affiliation:
Department of Chemistry, University of California Berkeley, Berkeley, CAUSA Department of Physics, University of California Berkeley, Berkeley, CAUSA Materials Science Division, Lawrence Berkeley National Lab, Berkeley CAUSA
Nasim Alem
Affiliation:
National Center for Electron Microscopy, Berkeley, CAUSA Department of Materials Science, Pennsylvania State University, State College, PAUSA
Jian-Hao Chen
Affiliation:
Department of Physics, University of California Berkeley, Berkeley, CAUSA Department of Physics, Peking University, Beijing, China
Jim Ciston
Affiliation:
National Center for Electron Microscopy, Berkeley, CAUSA
Alex Zettl
Affiliation:
Department of Physics, University of California Berkeley, Berkeley, CAUSA Materials Science Division, Lawrence Berkeley National Lab, Berkeley CAUSA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1770 - 1771
Copyright
Copyright © Microscopy Society of America 2014 

References

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[10] This work was supported in part by the Director, Office of Energy Research, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, of the U.S. Department of Energy under Contract #DE-AC02-05CH11231,the Office of Naval Research under MURI award N00014-09-1-1066; and the Air Force Office of Scientific Research under grant #FA9950-10-1-0451. Transmission electron microscopy work was performed at the National Center for Electron Microscopy; AG acknowledges support from an NSF graduate research fellowship.Google Scholar