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The Focused Ion Beam-SEM as a Critical Tool For Nano-scale Characterization of Highly Radioactive Nuclear Fuels

Published online by Cambridge University Press:  27 August 2014

James I. Cole ,
Assel Aitkaliyeva ,
James W. Madden  and
Brandon D. Miller
James I. Cole
Affiliation:
Nuclear Science and Technology, Idaho National Laboratory, Idaho Falls, USA
Assel Aitkaliyeva
Affiliation:
Nuclear Science and Technology, Idaho National Laboratory, Idaho Falls, USA
James W. Madden
Affiliation:
Nuclear Science and Technology, Idaho National Laboratory, Idaho Falls, USA
Brandon D. Miller
Affiliation:
Nuclear Science and Technology, Idaho National Laboratory, Idaho Falls, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1808 - 1809
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Miller, B., Gan, J., Madden, J., Jue, J. F., Robinson, A., Keiser, D. D. J. Nucl. Mater. 424, 38 (2012).Google Scholar
[2] Teague, M., Gorman, B., Miller, B., King, J. J. Nucl. Mater. 444, 475 (2014).Google Scholar
[3] Rita Kirchhofer, John D. Hunn, Demkowicz, Paul A., Cole, James I., Gorman, Brian P. “Microstructure of TRISO coated particles from the AGR-1 experiment: SiC grain size and grain boundary character”, Journal of Nuclear Materials 432 (2013). 127–134.Google Scholar