Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Electron Microscopy of Materials for Electrochemical Power Systems

Abstract

Electron Microscopy Observations Over the Processes Yielding to Obtaining TiO2from Natural Ilmenite Mineral

Combining Simulation, Experiment, and Data Science for Materials Characterization and Design

Abstract

Is HRTEM Image Simulation Correct? A Premise-Free Calibration Approach

Surface and Point Defect Measurements of Detonation Nanodiamond using Combined Cs-Cc corrected TEM and ab initio Calculations

The Origin of Magnetic Ordering in Sr3YCo4O10+x

Correlative Microscopic, Spectroscopic, and Computational Analysis of the Nucleation and Growth of Europium (III) Oxalate Nanoparticles

Atomistic Study of Model CdTe Grain Boundaries

Probing the subtleties of atomic distortions through accurate STEM imaging and density functional theory

Direct observation of local chemistry and local cation displacements in the relaxor ferroelectric PMN-PT

Denoising of Atomic-Scale Images Based on Automatic Grain Segmentation, Unsupervised Primitive Unit Cell Extraction and Periodic Block-Matching

Combining Non-Rigid Registration with Non-Local Principle Component Analysis for Atomic Resolution EDS Mapping

Theory and Parameter Free Calculations of EELS and X-ray Spectra

Low-Loss Imaging of Defect Structures in Two Dimensional Materials Using Aberration Corrected Scanning Transmission Electron Microscopy

Multimodal Acquisition of Properties and Structure with Transmission Electron Reciprocal-space (MAPSTER) Microscopy

Quantitative Imaging of Probability Current Flow in Real and Momentum Space

Big, deep, and smart data from atomically resolved images: exploring the origins of materials functionality

Deep Data Mining in a Real Space: Application to Scanning Probe Microscopy Studies on a “Parent” State of a High Temperature Superconductor

Automated Data Acquisition and Indexing of Electron Channeling Patterns using the Dictionary Approach

EELS Mapping with Random Scan

Alloying in Flexible Transition-metal Chalcogenide Nanowires

Multidisciplinary Approach to Nanostructure Determination

Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Electron Microscopy of Materials for Electrochemical Power Systems

Abstract

Combining Simulation, Experiment, and Data Science for Materials Characterization and Design

Abstract