INSTRUMENTATION & METHODS
New Methods
Abstract
X-ray Phase Contrast Imaging Technique Using Bilens Interferometer.
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- 10 August 2018, pp. 162-163
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A Pipeline for Distributed Segmentation of Teravoxel Tomography Datasets
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- 10 August 2018, pp. 164-165
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Analytical and Instrumentation Science Symposia
Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy
Abstract
Sample preparation for aberration-corrected microscopy of high-quality TEM specimens of advanced integrated circuits
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 150-151
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INSTRUMENTATION & METHODS
New Methods
Abstract
3D Observation of Quasicrystal Alloy Using X-ray Differential Phase-Contrast Microscope with a Zone Plate
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- 10 August 2018, pp. 166-167
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Analytical and Instrumentation Science Symposia
Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy
Abstract
Spherical Aberration Correction for SEMs with Electrostatic-type Compact Cs-corrector
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- 01 August 2018, pp. 152-153
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Sunlight Active Perovskites (TiCh-CoTiCb) with Effective Dye Degradation and Water Splitting
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- 01 August 2018, pp. 154-155
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INSTRUMENTATION & METHODS
New Instruments
Abstract
High-resolution 3D scanning X-ray microscopes at the Swiss Light Source
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- 10 August 2018, pp. 168-171
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X-Ray Microscopy at Sirius, the New Brazilian Synchrotron Light Source
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- 10 August 2018, pp. 172-175
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Analytical and Instrumentation Science Symposia
Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy
Abstract
The Morphology of TiiAlC (M2AX) and TiiC (MXene) Sheets Revealed by HAADF STEM Analysis
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- 01 August 2018, pp. 156-157
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Towards Atomic-Scale Fabrication in Silicon
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- 01 August 2018, pp. 158-159
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INSTRUMENTATION & METHODS
New Instruments
Abstract
Combined 3D Chemical and Morphological Characterization Using Innovative Lab-based Equipment
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- Published online by Cambridge University Press:
- 10 August 2018, pp. 176-179
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Scanning Compton X-ray Microscopy
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- Published online by Cambridge University Press:
- 10 August 2018, pp. 180-181
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Analytical and Instrumentation Science Symposia
Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy
Abstract
The Effect of Epitaxial Strain on Phase Stability in Double-Perovskite La2NiMnO6 Films
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- 01 August 2018, pp. 160-161
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INSTRUMENTATION & METHODS
New Instruments
Abstract
ID-Full Field Microscopy of Elastic and Inelastic Scattering with Transmission off-axis Fresnel Zone Plates
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- Published online by Cambridge University Press:
- 10 August 2018, pp. 182-183
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Analytical and Instrumentation Science Symposia
Atomic-scale Functional Imaging in Aberration-corrected Electron Microscopy
Abstract
Substrate Surface Roughness-Induced Antiphase Boundaries and Strain Relaxation in Cufe2o4 Films on Mgal2o4 (001) Substrates
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- 01 August 2018, pp. 162-163
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Structural and Magnetic Properties of Nanosized LiCoO2 Surfaces
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- 01 August 2018, pp. 164-165
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INSTRUMENTATION & METHODS
New Instruments
Abstract
Laboratory-based X-ray NanoCT Explores Morphology of a ZebrafishEmbryo
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- Published online by Cambridge University Press:
- 10 August 2018, pp. 184-185
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Scanning Hard X-Ray Microscopy Based on Be CRLs
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- Published online by Cambridge University Press:
- 10 August 2018, pp. 186-187
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Analytical and Instrumentation Science Symposia
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond
Abstract
A Next Generation Electron Microscopy Detector Aimed at Enabling New Scanning Diffraction Techniques and Online Data Reconstruction
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- 01 August 2018, pp. 166-167
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Correlation of Strain and Elemental Distribution at the Interface Using Simultaneous Energy-Filtered High-Speed 4D STEM Diffraction Imaging and EDS
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- 01 August 2018, pp. 168-169
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