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Scanning Hard X-Ray Microscopy Based on Be CRLs

Published online by Cambridge University Press:  10 August 2018

Andreas Schropp ,
Dennis Bruckner ,
Jessica Bulda ,
Gerald Falkenberg ,
Jan Garrevoet ,
Frank Seiboth ,
Felix Wittwer ,
Frieder Koch ,
Christian David  and
Christian G. Schroer
Andreas Schropp*
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany
Dennis Bruckner
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany Universitat Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany Ruhr Universitat Bochum, Universitatsstr. 150, D-44780 Bochum, Germany
Jessica Bulda
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany Universitat Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany
Gerald Falkenberg
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany
Jan Garrevoet
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany
Frank Seiboth
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA
Felix Wittwer
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany Universitat Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany
Frieder Koch
Affiliation:
Paul Scherrer Institut (PSI), 5232 Villigen, Switzerland
Christian David
Affiliation:
Paul Scherrer Institut (PSI), 5232 Villigen, Switzerland
Christian G. Schroer
Affiliation:
Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, D-22607 Hamburg, Germany Universitat Hamburg, Luruper Chaussee 149, D-22761 Hamburg, Germany
*
*Corresponding author: [email protected]

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 186 - 187
Copyright
© Microscopy Society of America 2018 

References

[1] Seiboth, F., et al, Nat. Comm 8, 14623 2017.Google Scholar
[2] Seiboth, F., et al, J. Synchrotron Rad 25, 108–115, 2018.Google Scholar
[3] Baier, S., et al., Microsc. Microanal 22, 178–188, 2016.Google Scholar
[4] Falkenberg, G., et al, J. Phys. Conf. Ser 463, 012016 2013.CrossRefGoogle Scholar
[5] Schropp, A., et al, Appl. Phys. Lett 96, 091102 2010.Google Scholar
[6] Schropp, A., et al, J. Microsc 241, 9–12, 2010.Google Scholar
[7] Wilke, R. N., et al, Geomicrobiol. J 32, 380–393, 2015.Google Scholar
[8] Schropp, A., et al, Appl. Phys. Lett 100, 253112 2012.CrossRefGoogle Scholar