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ID-Full Field Microscopy of Elastic and Inelastic Scattering with Transmission off-axis Fresnel Zone Plates

Published online by Cambridge University Press:  10 August 2018

F. Doring ,
F. Marschall ,
Z. Yin ,
B. Rosner ,
M. Beye ,
P. Miedema ,
K. Kubicek ,
L. Glaser ,
D. Raiser  and
J. Soltau
...Show all authors
F. Doring
Affiliation:
Paul Scherrer Institut, Villigen-PSI, 5232, Switzerland
F. Marschall
Affiliation:
Paul Scherrer Institut, Villigen-PSI, 5232, Switzerland
Z. Yin
Affiliation:
Deutsches Elektronen-Synchrotron DESY, Photon Science, Hamburg, 22607, Germany Max Planck Institute for Biophysical Chemistry, Gottingen, 37077, Germany
B. Rosner
Affiliation:
Paul Scherrer Institut, Villigen-PSI, 5232, Switzerland
M. Beye
Affiliation:
Deutsches Elektronen-Synchrotron DESY, Photon Science, Hamburg, 22607, Germany
P. Miedema
Affiliation:
Deutsches Elektronen-Synchrotron DESY, Photon Science, Hamburg, 22607, Germany
K. Kubicek
Affiliation:
Deutsches Elektronen-Synchrotron DESY, Photon Science, Hamburg, 22607, Germany
L. Glaser
Affiliation:
Deutsches Elektronen-Synchrotron DESY, Photon Science, Hamburg, 22607, Germany
D. Raiser
Affiliation:
Max Planck Institute for Biophysical Chemistry, Gottingen, 37077, Germany
J. Soltau
Affiliation:
Georg-August-Universitat, Gottingen, 37077, Germany
V.A. Guzenko
Affiliation:
Paul Scherrer Institut, Villigen-PSI, 5232, Switzerland
J. Viefhaus
Affiliation:
Deutsches Elektronen-Synchrotron DESY, Photon Science, Hamburg, 22607, Germany
J. Buck
Affiliation:
Deutsches Elektronen-Synchrotron DESY, Photon Science, Hamburg, 22607, Germany
M. Risch
Affiliation:
Georg-August-Universitat, Gottingen, 37077, Germany
S. Techert
Affiliation:
Deutsches Elektronen-Synchrotron DESY, Photon Science, Hamburg, 22607, Germany Georg-August-Universitat, Gottingen, 37077, Germany Max Planck Institute for Biophysical Chemistry, Gottingen, 37077, Germany
C. David
Affiliation:
Paul Scherrer Institut, Villigen-PSI, 5232, Switzerland

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 182 - 183
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Ament, L, et al, Rev. Mod. Phys 83 2011 705–767.CrossRefGoogle Scholar
[2] Warwick, T, et al, J. Synchrotron Radiat. 8 2014 736–743.CrossRefGoogle Scholar
[3] Marschall, F, et al, Scientific Reports 7 2017 8849.CrossRefGoogle Scholar
[4] This work received funding from the EU-H2020 Research and Innovation Programme under the Marie Sklodowska-Curie grant agreement No. 701647, grant agreement No. 654360 NFFA-Europe and the Deutsche Forschungsgemeinschaft, SFB 1073.Google Scholar