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Scanning Compton X-ray Microscopy

Published online by Cambridge University Press:  10 August 2018

Pablo Villanueva-Perez ,
Sasa Bajt  and
Henry N. Chapman
Pablo Villanueva-Perez*
Affiliation:
Center for Free-Electron Laser Science, DESY, Notkestrasse 85, 22607Hamburg, Germany
Sasa Bajt
Affiliation:
Photon Science, DESY, NotkestraBe 85, 22607Hamburg, Germany
Henry N. Chapman
Affiliation:
Center for Free-Electron Laser Science, DESY, Notkestrasse 85, 22607Hamburg, Germany Department of Physics, University of Hamburg, Luruper Chaussee 149, 22761Hamburg, Germany Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761Hamburg, Germany
*
*Corresponding author, [email protected]

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 180 - 181
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Villanueva-Perez, P., Bajt, S. Chapman, H. N. Optica in press.Google Scholar
[2] Howells, M., et al, J. Electron. Spectrosc. Relat. Phenom. 12, 35016 2010.Google Scholar
[3] Villanueva-Perez, P., et al, Opt. Express 24(4), 3189–3201, 2016.CrossRefGoogle Scholar
[4] The authors acknowledge funding from Program-Oriented Funds of the Helmholtz Association to DESY and through the Gottfried Wilhelm Leibniz Program of the DFG. The authors thank A. Meents, I. Mohacsi, K. Murray, M. Prasciolu, M. Tischer, and T. White for their fruitful discussions.Google Scholar