Microscopy and Microanalysis: Volume 21 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

Determination of Reliable Grain Boundary Orientation using Automated Crystallographic Orientation Mapping in the Transmission Electron Microscope

The Presence of Higher-Order Laue Zone Intensities and the Relrod Effect in Cubic Metals in the Transmission Electron Microscope

Semi-Automated DigitalMicrograph Routine for Real-Time Phase Identification

Improving Spatial Detection of Twins Achieved by Measuring Individual Kikuchi Band Intensity in EBSD Patterns

Transmission Electron Backscatter Diffraction (tEBSD) analysis of Au Thin Films

Automated Image Alignment and Distortion Removal for 3-D Serial Sectioning with Electron Backscatter Diffraction

Growth and Characterization of (110) InAs Quantum Well Heterostructures by Transmission Electron Microscopy and Electron Channeling Contrast Imaging

Techniques for Transmission EBSD Mapping of Atom Probe Specimens

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Characterization of Sulfonated Polysulfone Polymers by EELS

Structural and Optical Properties of AlGaN MQWs Grown by MOCVD Using One and Two TMG Sources

Probing Plasmons in Three Dimensions within Random Morphology Nanostructures

Strong Coupling between ZnO Exciton and Localized Surface Plasmon in Ag Nanoparticles Studied by STEM-EELS

Advances in Scanning Transmission Electron Microscope Cathodoluminescence

A16 Advances in Electron and Ion Scanning Microscopies

Abstract

Modeling Ion Beam Induced Secondary Electrons

Scanning Helium Ion Microscopy-Induced Secondary Electron Yields of Composite Materials

Study of SEM images obtained with an electron energy and take-off angle (E-θ) selective detector

Repetitive Observation of Coniferous Samples in ESEM and SEM

The Size and Morphological Study of Spherical Polyelectrolyte Complex Beads Using Environmental Scanning Electron Microscopy

Morphological and Chemical Analysis of Impurities in Ice Using the Environmental Scanning Electron Microscopy and Fluorescence Spectroscopy

Dynamic Gas Environmental System Development for in situ Real-time SEM Imaging under Atmospheric Pressure

Microscopy and Microanalysis

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Volume 21 - August 2015

Analytical and Instrumentation Science Symposia

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

A16 Advances in Electron and Ion Scanning Microscopies

Abstract