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Transmission Electron Backscatter Diffraction (tEBSD) analysis of Au Thin Films

Published online by Cambridge University Press:  23 September 2015

Eliot Estrine ,
Nicholas Seaton ,
Prabesh Dulal  and
Bethanie Stadler
Eliot Estrine
Affiliation:
ECE Department, University of Minnesota, Minneapolis, MN
Nicholas Seaton
Affiliation:
Characterization Facility, University of Minnesota, Minneapolis, MN
Prabesh Dulal
Affiliation:
ECE Department, University of Minnesota, Minneapolis, MN
Bethanie Stadler
Affiliation:
ECE Department, University of Minnesota, Minneapolis, MN

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1671 - 1672
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Rausch, T., Chu, A. S., Lu, P., Puranam, S., Nagulapally, D. & Dykes, J. Recording Performance of a Pulsed HAMR Architecture 2014.Google Scholar
[2] Link, S., Wang, Z. L. & El-Sayed, M. A., The Journal of Physical Chemistry B 104, 33 (2000).Google Scholar
[3] Brandon, D., Acta Metallurgica 14, 11 (1966).CrossRefGoogle Scholar
[4] Keller, R. & Geiss, R., J. Microsc 245, 3 (2012).CrossRefGoogle Scholar