Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-30T05:50:57.300Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural and Optical Properties of AlGaN MQWs Grown by MOCVD Using One and Two TMG Sources

Published online by Cambridge University Press:  23 September 2015

Shuo Wang ,
Hongen Xie ,
Yong O. Wei ,
Alec M. Fischer ,
Fernando A. Ponce ,
M. Moseley ,
B. Gunning  and
W. A. Doolittle
Shuo Wang
Affiliation:
Department of Physics, Arizona State University, Tempe AZ 85287-1504, U.S.A
Hongen Xie
Affiliation:
Department of Physics, Arizona State University, Tempe AZ 85287-1504, U.S.A
Yong O. Wei
Affiliation:
Department of Physics, Arizona State University, Tempe AZ 85287-1504, U.S.A
Alec M. Fischer
Affiliation:
Department of Physics, Arizona State University, Tempe AZ 85287-1504, U.S.A
Fernando A. Ponce
Affiliation:
Department of Physics, Arizona State University, Tempe AZ 85287-1504, U.S.A
M. Moseley
Affiliation:
Advanced Semiconductor Technology Facility, School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, U.S.A.
B. Gunning
Affiliation:
Advanced Semiconductor Technology Facility, School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, U.S.A.
W. A. Doolittle
Affiliation:
Advanced Semiconductor Technology Facility, School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, U.S.A.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1681 - 1682
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Nellist, P. D. & Pennycook, S. J., Adv. Imag. Electr. Phys 113 (2000). p. 147.Google Scholar
[2] The authors gratefully acknowledge the use of facilities within the LeRoy Eyring Center for Solid State Science at Arizona State University.Google Scholar