Editorial
Editorial
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- Published online by Cambridge University Press:
- 17 March 2004, p. 173
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Quantitative Transmission Electron Microscopy at Jülich, Germany
High-Resolution Transmission Electron Microscopy Using Negative Spherical Aberration
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- 17 March 2004, pp. 174-184
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Spherical Aberration Correction in Tandem with Exit-Plane Wave Function Reconstruction: Interlocking Tools for the Atomic Scale Imaging of Lattice Defects in GaAs
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- 17 March 2004, pp. 185-198
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Quantitative Transmission Electron Microscopy Analysis of the Pressure of Helium-Filled Cracks in Implanted Silicon
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- 17 March 2004, pp. 199-214
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Papers from the InterAmerican Congress on Electron Microscopy
A Morphological and Cytochemical Study of the Interaction between Paracoccidiodes brasiliensis and Neutrophils
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- 17 March 2004, pp. 215-223
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Characterization of Defects and Surface Structures in Microporous Materials by HRTEM, HRSEM, and AFM
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- 17 March 2004, pp. 224-235
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Measurement of Lattice Displacements at Planar Defects in 2H and 18R Martensites
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- 17 March 2004, pp. 236-246
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Biological Applications
Altered Mitochondrial Structure and Motion Dynamics in Living Cells with Energy Metabolism Defects Revealed by Real Time Microscope Imaging
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- 17 March 2004, pp. 247-260
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A Low-Dose Electron Diffraction Assay for Protection of Protein Structure against Damage from Drying
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- 17 March 2004, pp. 261-269
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Structural Impacts on Thallus and Algal Cell Components of Two Lichen Species in Response to Low-Level Air Pollution in Pacific Northwest Forests
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- 17 March 2004, pp. 270-279
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Scanning Electron Microscopy of the Endometrium of Mares Infused with Gentamicin
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- 17 March 2004, pp. 280-285
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Atomic Force Microscopy Studies on DNA Structural Changes Induced by Vincristine Sulfate and Aspirin
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- 17 March 2004, pp. 286-290
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Materials Applications
Depth-Dependent Imaging of Individual Dopant Atoms in Silicon
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- 17 March 2004, pp. 291-300
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The Formation of Clusters and Nanocrystals in Er-Implanted Hexagonal Silicon Carbide
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- 17 March 2004, pp. 301-310
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Site-Specific Specimen Preparation by Focused Ion Beam Milling for Transmission Electron Microscopy of Metal Matrix Composites
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- 17 March 2004, pp. 311-316
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Calendar
Calendar of Meetings and Courses
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- 17 March 2004, pp. 317-322
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