Microscopy and Microanalysis: Volume 18 - Proceedings of Microscopy & Microanalysis 2012

STEM and STEM EELS Characterization of Low Defect Density, Smooth Fe3O4 Thin Films on Buffered Si by Kinetically Controlled Selective Oxidation
F. Shi, H. Xiang, Y. Chang, P.M. Voyles, M.S. Rzchowski
Published online by Cambridge University Press:

23 November 2012, pp. 322-323
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Progress with the Sandia Titan G2 80-200 with 0.7sr Integral SDD Array
P.G. Kotula, P. Lu, D.F. Susan, Z. Ghanbari, J. Ringnalda
Published online by Cambridge University Press:

23 November 2012, pp. 324-325
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Initial Results from a 200 kV UltraSTEM
A.R. Lupini, S.J. Pennycook, D. Hernandez-Maldonado, S.I. Molina
Published online by Cambridge University Press:

23 November 2012, pp. 326-327
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Spatially-Resolved Diffractometry with Atomic-Column Resolution
K. Kimoto, K. Ishizuka
Published online by Cambridge University Press:

23 November 2012, pp. 328-329
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Monochromated STEM with high energy and spatial resolutions
O.L. Krivanek, T.C. Lovejoy, G.J. Corbin, N. Dellby, M.F. Murfitt, N. Kurz, P.E. Batson, R.W. Carpenter
Published online by Cambridge University Press:

23 November 2012, pp. 330-331
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique
M. Takeguchi, A. Hashimoto, K. Mitsuishi, X. Zhang, M. Shimojo, P. Wang, N.D. Peter, A.I. Kirkland
Published online by Cambridge University Press:

23 November 2012, pp. 332-333
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Development of an Ad-Hoc Aberration Auto-tuning Procedure on an Oriented Crystalline Specimen in Aberration-Corrected Scanning Transmission Electron Microscopy: the SIAM Method
M. Watanabe, H. Sawada
Published online by Cambridge University Press:

23 November 2012, pp. 334-335
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications
F. Nan, S. Hosseini Vajargah, D. Rossouw, S.Y. Woo, M. Bugnet, M.C. Chan, N. Gauquelin, S. Stambula, G. Zhu, G. Botton
Published online by Cambridge University Press:

23 November 2012, pp. 336-337
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Planar defects in patterned GaAs by aberration corrected STEM
R. dos Reis, Z. Liliental-Weber, C. Ophus, J. Jimenez, M. Snure, B. Gerard
Published online by Cambridge University Press:

23 November 2012, pp. 338-339
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantitative Atomic-resolution Imaging and Spectroscopy of a 2D Silica Glass
P.Y. Huang, R. Hovden, Q. Mao, D.A. Muller, S. Kurasch, U. Kaiser, J. Kotakoski, A. Krasheninnikov, A. Srivastava, V. Skakalova, J. Smet, J. Meyer
Published online by Cambridge University Press:

23 November 2012, pp. 340-341
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Single Atom Microscopy
W. Zhou, J. Lee, A.R. Lupini, S.J. Pennycook, J. Idrobo, M.P. Prange, M.P. Oxley, S.T. Pantelides, O.L. Krivanek
Published online by Cambridge University Press:

23 November 2012, pp. 342-343
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Substitutional and Interstitial Diffusion of Ni across the NiSi/Si interface
A. Thron, K. van Benthem, J. Chan, C.L. Hinkle, T.J. Pennycook, S.J. Pennycook, A. Jain
Published online by Cambridge University Press:

23 November 2012, pp. 344-345
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Investigation of Grain Boundary Structure and Composition of Bismuth Embrittled Copper Bicrystals with Aberration-Corrected Scanning Transmission Electron Microscopy
C. Wade, M. McLean, R. Vinci, M. Watanabe, L. Giannuzzi
Published online by Cambridge University Press:

23 November 2012, pp. 346-347
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Direct observation of vacancies and iron atoms in a Mg-rich olivine using Z-contrast imaging
H. Konishi, H. Xu
Published online by Cambridge University Press:

23 November 2012, pp. 348-349
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Single-Atom Catalysis: Pt1/FeOx for CO Oxidation and Preferential Oxidation of CO in H2
B. Qiao, J. Liu, L. Allard, A. Wang, Y. Cui, T. Zhang, X. Yang, J. Li, Z. Jiang
Published online by Cambridge University Press:

23 November 2012, pp. 350-351
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantitative HAADF-studies of GaP/Si-interfaces
B. Haas, A. Beyer, J. Ohlmann, W. Stolz, K. Volz
Published online by Cambridge University Press:

23 November 2012, pp. 352-353
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

The Role of Aberration-corrected STEM in Developing Supported Catalysts
J. Liu
Published online by Cambridge University Press:

23 November 2012, pp. 354-355
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Beyond the limits of imaging: advances and applications of model-based scanning transmission electron microscopy
S. Van Aert, G.T. Martinez, A. De Backer, G. Van Tendeloo, A. Rosenauer
Published online by Cambridge University Press:

23 November 2012, pp. 356-357
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Understanding Gold Growth on Magnetite Nanoparticles using Probe-Corrected Scanning Transmission Electron Microscopy
E.C. Mattson, M. Gajdardziska-Josifovska, P.M. Voyles, E.S. Krystofiak, J.A. Oliver
Published online by Cambridge University Press:

23 November 2012, pp. 358-359
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantitative STEM Study of the β'-Ge Phase in Al-Mg-Ge Alloys
R. Bjørge, R. Holmestad, C. Marioara, S. Andersen, M. Weiland, J. Etheridge
Published online by Cambridge University Press:

23 November 2012, pp. 360-361
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Applications of Aberration-Corrected STEM and SEM-03

Research Article

STEM and STEM EELS Characterization of Low Defect Density, Smooth Fe3O4 Thin Films on Buffered Si by Kinetically Controlled Selective Oxidation

Progress with the Sandia Titan G2 80-200 with 0.7sr Integral SDD Array

Initial Results from a 200 kV UltraSTEM

Applications of Aberration-Corrected STEM and SEM-04

Research Article

Spatially-Resolved Diffractometry with Atomic-Column Resolution

Monochromated STEM with high energy and spatial resolutions

Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

Development of an Ad-Hoc Aberration Auto-tuning Procedure on an Oriented Crystalline Specimen in Aberration-Corrected Scanning Transmission Electron Microscopy: the SIAM Method

Applications of Aberration-Corrected STEM and SEM-05

Research Article

Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications

Planar defects in patterned GaAs by aberration corrected STEM

Quantitative Atomic-resolution Imaging and Spectroscopy of a 2D Silica Glass

Single Atom Microscopy

Applications of Aberration-Corrected STEM and SEM-06

Research Article

Substitutional and Interstitial Diffusion of Ni across the NiSi/Si interface

Investigation of Grain Boundary Structure and Composition of Bismuth Embrittled Copper Bicrystals with Aberration-Corrected Scanning Transmission Electron Microscopy

Direct observation of vacancies and iron atoms in a Mg-rich olivine using Z-contrast imaging

Single-Atom Catalysis: Pt1/FeOx for CO Oxidation and Preferential Oxidation of CO in H2

Quantitative HAADF-studies of GaP/Si-interfaces

The Role of Aberration-corrected STEM in Developing Supported Catalysts

Applications of Aberration-Corrected STEM and SEM-07

Research Article

Beyond the limits of imaging: advances and applications of model-based scanning transmission electron microscopy

Understanding Gold Growth on Magnetite Nanoparticles using Probe-Corrected Scanning Transmission Electron Microscopy

Quantitative STEM Study of the β'-Ge Phase in Al-Mg-Ge Alloys

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Applications of Aberration-Corrected STEM and SEM-03

Research Article

Applications of Aberration-Corrected STEM and SEM-04

Research Article

Applications of Aberration-Corrected STEM and SEM-05

Research Article

Applications of Aberration-Corrected STEM and SEM-06

Research Article

Applications of Aberration-Corrected STEM and SEM-07

Research Article