Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-28T09:11:09.101Z Has data issue: false hasContentIssue false
  • English
  • Français

Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

Published online by Cambridge University Press:  23 November 2012

M. Takeguchi ,
A. Hashimoto ,
K. Mitsuishi ,
X. Zhang ,
M. Shimojo ,
P. Wang ,
N.D. Peter  and
A.I. Kirkland
M. Takeguchi
Affiliation:
National Institute for Materials Science, Tsukuba, Ibaraki, Japan
A. Hashimoto
Affiliation:
National Institute for Materials Science, Tsukuba, Ibaraki, Japan
K. Mitsuishi
Affiliation:
National Institute for Materials Science, Tsukuba, Ibaraki, Japan
X. Zhang
Affiliation:
Saitama Institute of Technology, Fukaya, Saitama, Japan
M. Shimojo
Affiliation:
Shibaura Institute of Technology, Toyosu, Tokyo, Japan
P. Wang
Affiliation:
University of Oxford, Oxford, Oxford, United Kingdom
N.D. Peter
Affiliation:
University of Oxford, Oxford, Oxford, United Kingdom
A.I. Kirkland
Affiliation:
University of Oxford, Oxford, Oxford, United Kingdom
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 332 - 333
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)