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Beyond the limits of imaging: advances and applications of model-based scanning transmission electron microscopy

Published online by Cambridge University Press:  23 November 2012

S. Van Aert ,
G.T. Martinez ,
A. De Backer ,
G. Van Tendeloo  and
A. Rosenauer
S. Van Aert
Affiliation:
Department of Physics, EMAT - University of Antwerp, Antwerp, Belgium
G.T. Martinez
Affiliation:
Department of Physics, EMAT - University of Antwerp, Antwerp, Belgium
A. De Backer
Affiliation:
Department of Physics, EMAT - University of Antwerp, Antwerp, Belgium
G. Van Tendeloo
Affiliation:
Department of Physics, EMAT - University of Antwerp, Antwerp, Belgium
A. Rosenauer
Affiliation:
Institut für Festkörperphysik - University of Bremen, Bremen, Germany
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 356 - 357
Copyright
Copyright © Microscopy Society of America 2012

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