Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Physical Science Symposia

In-situ Methods for Probing Properties and Dynamics in Materials

Abstract

Preferential growth of carbon nanotubes via the carbon volume diffusion channels in Fe3C nanoparticles

In-situ TEM Characterization of Ultra-robust Memristors Based on Fully Layered Two-dimensional Materials

Electron Microscopy Characterization of the Synergistic Effects between Pd, Au NPs, and Their Graphene Support

Double-tilt in situ TEM Holder with Ultra-high Stability

In situ TEM Investigation of Anti-sintering Au@Pt Core-shell Nanostructures on MoS2 at Elevated Temperatures

Use of a MEMS-Based TEM Heating Stage to Characterize Carbide Precipitation in Alloy 690

Effects of Photoinduced Elastic Responses on Debye-Waller Temperature Measurements

Spatially-Resolved Strain-Wave Dynamics in MoS2

In Situ Lorentz Differential Phase Contrast STEM Characterization of Rashba Interaction on Skyrmion Thin Films

In-situ Heating Experiments Within a Tabletop SEM: Grain Growth and Dewetting of Thin Layers of Au and AuPd With and Without an Al2O3 Coating

Phase-Change Materials; the Challenges for TEM

Determination of Surface Dynamics on CeCh Nanoparticles Using Time-Resolved High-Resolution TEM

Anelastic Behavior in Crystalline Nanowires

Correlative In Operando Studies of Abusive Cycling Conditions for Li-ion Batteries

Directed Hypersonic Strain Waves Imaged with Ultrafast Electron Microscopy

Charge-Density Wave Localization and Co-Existence in 1T-TaS2

High Resolution S/TEM Imaging of High Density Domain Stacking and Coexisting Polar-nonpolar Phases in Layered Perovskite Ca3Mn2O7

Good Contacts for Quantitative In-Situ TEM Biasing Experiments with Movable Probes

Imaging Surface Plasma of Metals by Ultrafast Transmission Electron Microscopy

Correlative In-Situ Analysis on the Nanoscale by combination of AFM and SEM

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2018

Physical Science Symposia

In-situ Methods for Probing Properties and Dynamics in Materials

Abstract