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In-situ TEM Characterization of Ultra-robust Memristors Based on Fully Layered Two-dimensional Materials

Published online by Cambridge University Press:  01 August 2018

Songhua Cai ,
Miao Wang ,
Xiaoqing Pan ,
J. Joshua Yang ,
Feng Miao  and
Peng Wang
Songhua Cai
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China.
Miao Wang
Affiliation:
School of Physics, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China.
Xiaoqing Pan
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China. Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California, Irvine, CA, USA.
J. Joshua Yang
Affiliation:
Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA.
Feng Miao
Affiliation:
School of Physics, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China.
Peng Wang
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1886 - 1887
Copyright
© Microscopy Society of America 2018 

References

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[4] Helveg, S, et al, Phys. Rev. Lett. 84 2000) p. 5.Google Scholar