Microscopy and Microanalysis: Volume 24 - Proceedings of Microscopy & Microanalysis 2018

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2018

Physical Science Symposia

In-situ Methods for Probing Properties and Dynamics in Materials

Abstract

Direct Electron Detection for Atomic Resolution in situ EELS

Secondary Electron Contrast in STEM Electron Beam-Induced Current (EBIC): a Path Towards Mapping Electronic Structure

Ultrafast Electric-Field-Driven Control of the Structure of WTe2 via Terahertz Frequency Light Pulses

Imaging Coherent Acoustic Phonons in LaFeAsO with Ultrafast Electron Microscopy

A RF Broadband Biasing Holder for Ultrafast Stroboscopic Electron Microscopy

Electron Probes for Ultrafast Dynamics at the Nanoscale

Phase-Locked Transmission Electron Microscopy for Detecting Dynamic Responses of Heterogeneous Materials and Electrochemical Devices under an Alternating Electric Potential

Observing the Lithiation of M0S2

Lithium Electrochemistry of WS2 Nanoflakes Studied by In-situ TEM

In Situ Atomic-Scale TEM Observation of Phase Transformation in Two-Dimensional SnSe2 Single Crystals

In-situ Investigation of Multi-Step Lithiation of Tin Sulfide

In situ Visualization of Plasmon-Mediated Chemical Transformations at the Single and Sub-particle Level

Mapping Crystallization Kinetics of Phase-Change Materials Over Large Temperature Ranges Using Complementary In Situ Microscopy Techniques

Mapping Nanoscale Thermal Gradients in MoS2 using Plasmon Energy Shifts

3D Nano-Probes for Thermal Microscopy

Time-Resolved Electron Holography by Interference Gating

In-Situ S/TEM Probing of the Behavior of Nanoparticles Under Chemical and Electrochemical Reactions in the System Involving Solid, Liquid and Gas

Characterizing the Calcination Behaviors of Ni-Fe Layered Double Hydroxide Materials via In-situ Transmission Electron Microscopy

Gas Absorption and Pore Breathing of Metal-Organic Frameworks Studied Using in situ Environmental Transmission Electron Microscopy (ETEM)

Real-Time Data Processing and Feedback During In-Situ Heating

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2018

Physical Science Symposia

In-situ Methods for Probing Properties and Dynamics in Materials

Abstract