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Correlative In-Situ Analysis on the Nanoscale by combination of AFM and SEM

Published online by Cambridge University Press:  01 August 2018

M. Winhold ,
M. Leitner ,
P. Frank ,
N. Hosseini ,
J. Sattelkov ,
G.E. Fantner ,
H. Plank  and
C.H. Schwalb
M. Winhold
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.
M. Leitner
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.
P. Frank
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.
N. Hosseini
Affiliation:
Laboratory for Bio- and Nano-Instrumentation, Institute for Bioengineering, EPFL, Switzerland.
J. Sattelkov
Affiliation:
Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, Austria.
G.E. Fantner
Affiliation:
Laboratory for Bio- and Nano-Instrumentation, Institute for Bioengineering, EPFL, Switzerland.
H. Plank
Affiliation:
Institute for Electron Microscopy and Nanoanalysis, Graz University of Technology, Austria.
C.H. Schwalb
Affiliation:
GETec Microscopy GmbH, Vienna, Austria.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1922 - 1923
Copyright
© Microscopy Society of America 2018 

References

[1] Yablon, D., Werten, P., Winhold, M. Schwalb, C.H. Microscopy and Analysis 31(2), 14–18, 2017.Google Scholar
[2] Kreith, J., Strunz, T., Fantner, E.J., Fantner, G.E. Cordill, M.J. Rev. Sci. Instr. 88, 053704 2017.Google Scholar