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Recent developments in transmission electron microscopy imaging

Published online by Cambridge University Press:  17 November 2003

T. Épicier
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Abstract

A review of recent developments in imaging with a transmission electron microscope is proposed here. A first part is devoted to applications in the “imaging” mode: interest of field emission, “Z-contrast”, quantitative high resolution electron microscopy and reconstruction techniques. A second part will deal with the “diffraction” mode: convergent beam diffraction and “electron cristallography”.

Type
Research Article
Information
Metallurgical Research & Technology , Volume 100 , Issue 5: Science et Génie des MatériauxMatériaux et microscopies , May 2003 , pp. 449 - 462
Copyright
© La Revue de Métallurgie, 2003

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