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Crystallization temperatures of 5d–5d alloys
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- 31 January 2011, pp. 209-211
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Layered in situ copper/polyimide composite films
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- 31 January 2011, pp. 211-214
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Interface modifications for improving the adhesion of a-C:H films to metals
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- 31 January 2011, pp. 214-217
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Formation of intermetallic compounds during the sintering of zirconium–iron powders compact
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- 31 January 2011, pp. 219-225
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Surface mechanical properties of C implanted Ni
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- 31 January 2011, pp. 226-232
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Growth and characterization of Al–Cu–Li quasicrystals
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- 31 January 2011, pp. 233-237
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Nucleation, growth, and glass formation in an electron-beam surface-processed Cu47Zr53 alloy
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- 31 January 2011, pp. 238-247
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Co and Fe substitution in YBa2Cu3O7−δ
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- 31 January 2011, pp. 248-256
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Growth of a coherent precipitate from a supersaturated solution
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- 31 January 2011, pp. 257-266
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Calculation of diffuse scattering near Bragg reflections from coherent precipitates
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- 31 January 2011, pp. 267-273
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Toward a simple density functional theory of nonuniform solids
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- 31 January 2011, pp. 274-279
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Response of a stringlike dislocation loop to an external stress
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- 31 January 2011, pp. 280-297
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Precision measurements of the effect of implanted boron on silicon solid phase epitaxial regrowth
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- 31 January 2011, pp. 298-308
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A photoluminescence technique for characterizing the GaInAsP channeled substrate buried heterostructure wafer for lasing wavelength
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- 31 January 2011, pp. 309-313
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On the growth and composition of conductive filaments on the surface of As–Se–Te bulk glassy semiconductors
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- 31 January 2011, pp. 314-320
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Ion implantation in β-SiC: Effect of channeling direction and critical energy for amorphization
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- 31 January 2011, pp. 321-328
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An examination of organometallic thermal stability and its relevance to low-temperature MOCVD growth of HgCdTe
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- 31 January 2011, pp. 329-334
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Hydrogen incorporation mechanisms in the preparation of a-Si:H by ion bombardment-activated reactive evaporation
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- 31 January 2011, pp. 335-343
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Physical properties of spinel iron oxide thin films
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- 31 January 2011, pp. 344-350
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X-ray depth profiling of iron oxide thin films
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- 31 January 2011, pp. 351-356
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