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Heteroepitaxy and crystallographic orientation transition in La1.875Sr0.125NiO4 thin films on single crystal SrTiO3

Published online by Cambridge University Press:  14 May 2013

Adrian Podpirka ,
Viswanath Balakrishnan  and
Shriram Ramanathan
Adrian Podpirka*
Affiliation:
Department of Applied Physics, School of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138
Viswanath Balakrishnan
Affiliation:
Department of Applied Physics, School of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138
Shriram Ramanathan
Affiliation:
Department of Applied Physics, School of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

We investigate the orientation transition and strain relaxation in oxygenated epitaxial strontium-doped lanthanum nickelate, La1.875Sr0.125NiO4+δ (LSNO) thin films grown on single crystal strontium titanate, SrTiO3 (STO) substrates. Structural evolution has been studied as a function of film thickness by x-ray diffraction, pole figure analysis, and transmission electron microscopy (TEM). The LSNO layer grows epitaxial (OR1) with respect to the STO substrate with an orientation (001)OR1//(001)STO and <001>OR1//<001>STO. This orientation is maintained up to approximately 15 nm as observed from TEM, at which point it undergoes reorientation and lattice mismatch strain relaxation. The growth continues with a new orientation (OR2) as (100)OR2//(001)OR1 and with <100>OR2//<001>OR1 and <001>OR2//<001>OR1 with respect to the epitaxial LSNO layer. We consider possible mechanisms in detail leading to these phenomena given that the potassium nickel fluoride (K2NiF4)-structured lattice is able to accommodate excess oxygen interstitials and corresponding changes in the Ni valence state. By investigating the phase space of deposition parameters, we experimentally identify key factors leading to the reorientation phenomena.

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Articles
Information
Journal of Materials Research , Volume 28 , Issue 11 , 14 June 2013 , pp. 1420 - 1431
Copyright
Copyright © Materials Research Society 2013 

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References

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