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Annealing-induced lattice recovery in room-temperature xenon irradiated CeO2: X-ray diffraction and electron energy loss spectroscopy experiments

Published online by Cambridge University Press:  10 February 2015

Janne Pakarinen ,
Lingfeng He ,
Abdel-Rahman Hassan ,
Yongqiang Wang ,
Mahima Gupta ,
Anter El-Azab  and
Todd R. Allen
Janne Pakarinen*
Affiliation:
Department of Engineering Physics, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA; and Belgian Nuclear Research Center (SCK-CEN), Boeretang 200, B-2400 Mol, Belgium
Lingfeng He
Affiliation:
Department of Engineering Physics, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
Abdel-Rahman Hassan
Affiliation:
Department of Nuclear Engineering, Purdue University, West Lafayette, Indiana 47907, USA
Yongqiang Wang
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA
Mahima Gupta
Affiliation:
Department of Engineering Physics, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
Anter El-Azab
Affiliation:
Department of Nuclear Engineering, Purdue University, West Lafayette, Indiana 47907, USA
Todd R. Allen
Affiliation:
Department of Engineering Physics, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
*
a)Address all correspondence to this author. e-mail: [email protected]
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Abstract

A systematic x-ray diffraction (XRD) study was performed on room-temperature Xe-irradiated and postirradiation annealed CeO2. Large scale XRD did not show any additional irradiation-induced phases upon irradiation. Depth profiling the CeO2 (111) diffraction peak over the 150 nm deep Xe-irradiated layer (400 keV, 1 × 1020 Xe/m2) by grazing incidence XRD indicated a lattice expansion at the irradiated layer. Postirradiation annealing (1 h at 1000 °C) in an oxygen-containing environment removed the observed XRD features. Electron energy loss spectroscopy (EELS) was performed for cross-sectional samples before and after postirradiation annealing. EELS showed that the Ce charge state changed from +4 to +3 at the CeO2 surface indicating the presence of O vacancies in both as-irradiated and annealed samples. EELS also indicated that the amount of O vacancies was reduced at the irradiated region by annealing. The experimental results are discussed based on electronic properties of CeO2, annihilation of oxygen vacancies, and evolution of irradiation damage.

Keywords

radiation effectsx-ray diffraction (XRD)electron energy loss spectroscopy (EELS)
Type
Articles
Information
Journal of Materials Research , Volume 30 , Issue 9: Focus Issue: Characterization and Modeling of Radiation Damage on Materials: State of the Art, Challenges, and Protocols , 14 May 2015 , pp. 1555 - 1562
Copyright
Copyright © Materials Research Society 2015 

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Footnotes

Contributing Editor: Khalid Hattar

References

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