Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-24T06:22:11.353Z Has data issue: false hasContentIssue false
  • English
  • Français

In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression - ERRATUM

Published online by Cambridge University Press:  23 March 2020

Owen Brazil ,
Johann P. de Silva ,
Mithun Chowdhury ,
Heedong Yoon ,
Gregory B. McKenna ,
Warren C. Oliver ,
Jason Kilpatrick ,
John B. Pethica  and
Graham L.W. Cross
Get access

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Erratum
Information
Journal of Materials Research , Volume 35 , Issue 6 , 30 March 2020 , pp. 654
Copyright
Copyright © Materials Research Society 2020

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Brazil, O., de Silva, J.P., Chowdhury, M., Yoon, H., McKenna, G.B., Oliver, W.C., Kilpatrick, J., Pethica, J.B., and Cross, G.L.W.: In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression. J. Mater. Res. (2020).Google Scholar