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Characterization of heterogeneities in detector-grade CdZnTe crystals

Published online by Cambridge University Press:  31 January 2011

M.C. Duff ,
D.B. Hunter ,
A. Burger ,
M. Groza ,
V. Buliga ,
J.P. Bradley ,
G. Graham ,
Z.R. Dai ,
N. Teslich  and
D.R. Black
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M.C. Duff*
Affiliation:
Savannah River National Laboratory, Aiken, South Carolina 29808
D.B. Hunter
Affiliation:
Savannah River National Laboratory, Aiken, South Carolina 29808
A. Burger
Affiliation:
Savannah River National Laboratory, Aiken, South Carolina 29808
M. Groza
Affiliation:
Savannah River National Laboratory, Aiken, South Carolina 29808
V. Buliga
Affiliation:
Fisk University, Nashville, Tennessee 37208
J.P. Bradley
Affiliation:
Savannah River National Laboratory, Aiken, South Carolina 29808
G. Graham
Affiliation:
Savannah River National Laboratory, Aiken, South Carolina 29808
Z.R. Dai
Affiliation:
Savannah River National Laboratory, Aiken, South Carolina 29808
N. Teslich
Affiliation:
Lawrence Livermore National Laboratory, Livermore, California 94550
D.R. Black
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland 20899
A. Lanzirotti
Affiliation:
University of Chicago—Consortium for Advanced Radiation Sources (CARS), National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973
*
a) ddress all correspondence to this author. e-mail: [email protected]
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Abstract

Synthetic Cd1–xZnxTe or “CZT” crystals are highly suitable for γ-spectrometers operating at room temperature. Secondary phases (SP) within CZT, presumed to be Te metal, have detrimental impacts on the charge collection efficiency of fabricated device. Using analytical techniques rather than arbitrary theoretical definitions, we identify two SP morphologies: (i) many void, 20-μm “negative” crystals with 65-nm nanoparticle residues of Si, Cd, Zn, and Te and (ii) 20-μm hexagonal-shaped bodies, which are composites of metallic Te layers with cores of amorphous and polycrystalline CZT material that surround the voids.

Keywords

Second phasesSemiconductingTransmission electron microscopy (TEM)
Type
Articles
Information
Journal of Materials Research , Volume 24 , Issue 4 , April 2009 , pp. 1361 - 1367
Copyright
Copyright © Materials Research Society 2009

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