Article contents
Characteristics of tin whiskers formed on sputter-deposited films—an aging study
Published online by Cambridge University Press: 03 March 2011
Abstract
Tin whiskers formed on sputter-deposited films on Muntz metal substrates have been examined following long-term aging at room temperature. It was found that while the initial annealing conditions determined the original nucleation and growth rates, whisker nucleation and growth was a continuous process and appeared to be occurring throughout the duration of the study. Whisker densities increased for all samples during aging, and samples that initially showed no whiskers during high-temperature annealing had a population density of 2.5 mm−2 after storage for 15 months.
- Type
- Rapid Communications
- Information
- Copyright
- Copyright © Materials Research Society 2004
References
REFERENCES
- 8
- Cited by