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Design of a Real-Time Two-Dimensional Residual Stress Analyzer

Published online by Cambridge University Press:  06 March 2019

G. M. Borgonovi
G. M. Borgonovi*
Affiliation:
Science Applications International Corporation 10401 Roselle St. San Diego, CA 92121
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Extract

Measurements of residual stress by X-ray diffraction are usually carried out with diffractometers or with one-dimensional position sensitive detectors. The stress is determined from the displacement of the peak that results from intersecting a diffraction cone at high angle with the line scanned by the detector. If a two-dimensional flat detector is used, the intersection of the diffraction cone with the detector plane is a ring, or section of a ring, which is also slightly displaced by the stress. The suggestion has been made use a two-dimensional detector to determine the surface state of stress.

Type
X. X-Ray Stress Analysis, Fractography
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 523 - 526
Copyright
Copyright © International Centre for Diffraction Data 1986

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References

1. James, M. and Cohen, J.B., “PARS. A Fortable X. Ray Analyzer for Residual Stresses”, Journal of Testing and Evaluation, 6, 91, 1978.Google Scholar
2. Ruud, C.O. and Barrett, C.S., “Use of Cr K. Beta X-Rays and a Position Sensitive Detector for Residual Stress Measurement in Stainless Steel Pipe”, Advances in X. Ray Analysis, Vol. 22, 247, 1979,Google Scholar
3. Borgonovi, G.M., “Determination of Residual Stress from Two - Dimensional Diffraction Patterns”, Nondestructive Methods for Material Property Determination, Plenum Publishing Corporation, 47, 1984.Google Scholar