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The Concept of Pathlength Distributions Applied to Fundamental Parameter Approach

Published online by Cambridge University Press:  06 March 2019

H. Ebel ,
C. Pöhn ,
S. Svagera ,
M. Mantler ,
M. Wernle  and
M. F. Ebel
H. Ebel
Affiliation:
Institut für Angewandte und Technische Physik Technische Universität Wien A 1040 Vienna (Austria)
C. Pöhn
Affiliation:
Institut für Angewandte und Technische Physik Technische Universität Wien A 1040 Vienna (Austria)
S. Svagera
Affiliation:
Institut für Angewandte und Technische Physik Technische Universität Wien A 1040 Vienna (Austria)
M. Mantler
Affiliation:
Institut für Angewandte und Technische Physik Technische Universität Wien A 1040 Vienna (Austria)
M. Wernle
Affiliation:
Institut für Angewandte und Technische Physik Technische Universität Wien A 1040 Vienna (Austria)
M. F. Ebel
Affiliation:
Institut für Angewandte und Technische Physik Technische Universität Wien A 1040 Vienna (Austria)
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Extract

The fundamental parameter approach for quantitative x-ray fluorescence analysis is an application of the equations derived by Sherman and by Shiraiwa and Fujino. Both derivations assume plane and smooth specimen surfaces and defined entrance and take-off angles of x-rays. Our investigation is dedicated to a more general description of measured characteristic signals. Consequently we have to deal with equations that allow us to account for the parameters mentioned below.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 499 - 508
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

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