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TXRF with Various Excitation Sources

Published online by Cambridge University Press:  06 March 2019

Peter Wobrauschek ,
Peter Kregsamer ,
Christina Streli ,
Robert Rieder  and
Hannes Aiginger
Peter Wobrauschek
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A 1020 Wien, Austria
Peter Kregsamer
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A 1020 Wien, Austria
Christina Streli
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A 1020 Wien, Austria
Robert Rieder
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A 1020 Wien, Austria
Hannes Aiginger
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A 1020 Wien, Austria
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Abstract

Improving the detection limits in TXRF by optimizing the excitation conditions is the goal of this work. The properties of the exciting radiation due to spectral distribution, polarisation, intensity and energy are investigated and compared to find best conditions. Results are given from experiments performed with synchrotron radiation, Bragg polarized monoenergetic x-rays, high energy cut-off reflector in the primary beam path of a high power x-ray tube and several geometries for the sample reflector.

Type
XII. Total Reflection XRS
Information
Advances in X-Ray Analysis , Volume 35 , Issue B: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 925 - 931
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1 Wobrauschek, P., Kregsamer, P., Streli, C., Aiginger, H. Adv.X-Ray Anal. 34, 1 (1991)Google Scholar
2 Wobrauschek, P., Kregsamer, P., Spectrochim.Acta 44B, 458 (1989)10.1016/0584-8547(89)80050-3Google Scholar
3 Prange, A., Spectrochim.Acta 44B, 437 (1989)10.1016/0584-8547(89)80049-7Google Scholar
4 Schwenke, H., Berneike, W., Knoth, J., Weisbrod, U. Adv.X-Ray Anal. 32, 105(1989)Google Scholar
5 Wobrauschek, P., Kregsamer, P., Streli, C., Aiginger, H. X-Ray Spectrom. 20, 23 (1991)10.1002/xrs.1300200106Google Scholar
6 Iida, A., Adv.X-Ray Anal. 34, 23 (1991)Google Scholar
7 Knochel, A., Fresenius J.Anal.Chem. 337, 614 (1990)Google Scholar
8 Rigaku CatalogueGoogle Scholar
9 Wobrauschek, P., Aiginger, H., Adv.X-Ray Anal. 28, 69 (1985)Google Scholar
10 Schuster, M. Adv.X-Ray Anal. 34, 71 (1991)Google Scholar
11 Bilderback, D. H., Lairson, B. M., Barbee, T. W. Jr., Ice, G. E., Sparks, C. J. Jr., Nucl. Instr. & Meth, 208, 251 (1983)10.1016/0167-5087(83)91132-8Google Scholar