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Phase Microidentification from Selected Area Electron Diffraction (SAED) and Energy Dispersive Spectroscopy (EDS) Data

Published online by Cambridge University Press:  06 March 2019

Josef Macicek
Josef Macicek*
Affiliation:
Institute of Applied Mineralogy Bulgarian Academy of Sciences Rakovski 92, 1000 Sofia, Bulgaria
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Abstract

Two-dimensional geometry information contained in SAED spot patterns augmented with EDS elemental data is employed in a computerized phase identification of microcrystalline particles. The initial chemistry screening of a laboratory managed database using the 'bitmap' concept is followed by a geometry search/match treating of the spot patterns as planar sections through the reciprocal lattice of a candidate phase. The identification is selective, fast, and yields to a complete automatization,

Type
IX. XRD Applications: Detection Levitts, Superconductors, Organics, Minerals
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 687 - 691
Copyright
Copyright © International Centre for Diffraction Data 1991

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