Hostname: page-component-745bb68f8f-lrblm Total loading time: 0 Render date: 2025-01-24T10:01:01.680Z Has data issue: false hasContentIssue false
  • English
  • Français

Improvement of the Smoothing Procedure Via Preliminary Logarithmic Transformation of the X-Ray Spectrum

Published online by Cambridge University Press:  06 March 2019

Krassimir N. Stoev  and
Joseph E. Dlouhy
Krassimir N. Stoev
Affiliation:
Bulgarian Academy of Sciences Institute of Nuclear Research and Nuclear Energy Blvd. “Trakia” 72, 1784 Sofia, Bulgaria
Joseph E. Dlouhy
Affiliation:
Environment Canada Environment Technology Center 3439 River Road, Ottawa, Ontario K1A 0H3, Canada
Get access

Extract

Spectrum processing is a critical step in energy-dispersive X-ray fluorescence analysis, with very strong influence on the final performance of the method. Spectrum processing includes two major procedures: (i) preliminary processing (which deals mainly with reduction of random and systematic noise); and (ii) evaluation of peak parameters (most often peak area, and in some cases also peak position, amplitude and width). Preliminary processing solves two main problems: (i) search and correction of erroneous channel contents (outlier values); and (ii) random noise reduction. Several procedures for search and correction of outlier values have been proposed for Raman, gamma and X-ray spectra.

Type
IX. XRS Mathematical Methods, Trace Analysis and Other Applications
Information
Advances in X-Ray Analysis , Volume 38: Forty-third Annual Conference on Applications of X-ray Analysis , 1994 , pp. 673 - 680
Copyright
Copyright © International Centre for Diffraction Data 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Hilliy, K.J.D. and Morris, M.D., Appl. Spectrosa, 36:700 (1982)Google Scholar
2. Bussian, B.M. and Hardle, W., Appl. Spectrosc, 38:309 (1984)Google Scholar
3. de Beeck, O., “Description and structure of the programs GELIAN and MULTIP”, report of Institute of Nuclear Sciences, University of Ghent, Ghent, Belgium (1978)Google Scholar
4. Stoev, K.N., Appl. Radiat, Isotopes, 42:269 (1991)Google Scholar
5. Kauppinen, J.J.C., Moffatt, D.J., Mautson, H.H. and Cameron, D.G., Applied Optics, 21:1866 (1982)Google Scholar
6. Rhodes, E.C., “Smoothing. Tracts for Computers VI”, Cambridge University Press, N.Y., 1921 Google Scholar
7. Whittaker, E.T. and Robinson, G., “The Calculus of Observations”, 3rd ed., Blackie, Glasgow, 1940 Google Scholar
8. Hiderbrand, F.B., “Introduction to Numerical Analysis”, Mc Graw - Hill Book Company, New York, 1956 Google Scholar
9. Savitsky, A. and Golay, M.J.E., Analytical Chemistry, 36:1627 (1964)Google Scholar
10. Steiner, J., Termonia, Y. and Deltour, J., Analytical Chemistry, 44:1906 (1972)Google Scholar
11. Sterlinski, S., Nucl Instr. and Methods, 124:285 (1975)Google Scholar
12. Maden, H.H., Analytical Chemistry, 50:1383 (1978)Google Scholar
13. Proctor, A. and Sherword, P.M.A., Anaiyfical Chemistry, 52:2315 (190)Google Scholar
14. Bromba, M.N.A. and Ziedler, H., Analytical Chemistry, 53:1583 (1981)Google Scholar
15. Ziegler, H., Applied Spectroscopy, 35:88 (1981)Google Scholar
16. Marchand, P. and Marmet, L., Rev. Sdent. Instruments, 54:1034 (1983)Google Scholar
17. Stampfl, A., Riley, J.D. and Leckey, R., Nucl. Instrum. and Methods, B16:427 (1986)Google Scholar
18. Stoev, K.N. and Simova, E.S., Nucl. lustrum, and Methods, B35:173 (1988)Google Scholar
19. Hamming, R.W., “Digital Filters”, Prentice Hall Inc., Englewood, NJ, 1977 Google Scholar
20. JJenkins, R.W. Gould and Gedcke, D, “Quantitative X-ray Spectrometry”, p.337–341; Marsel Dekker, 1981 Google Scholar