Hostname: page-component-745bb68f8f-l4dxg Total loading time: 0 Render date: 2025-02-03T11:32:52.959Z Has data issue: false hasContentIssue false
  • English
  • Français

Automated Measurement of Grain Orientations and On-Line Determination of Complete Deformation Systems with a TEM

Published online by Cambridge University Press:  06 March 2019

R. A. Schwarzer  and
S. Zaefferer
R. A. Schwarzer
Affiliation:
Institut für Metallkunde und Metallphysik D-38678 Clausthal-Z., Germany
S. Zaefferer
Affiliation:
Institut für Metallkunde und Metallphysik D-38678 Clausthal-Z., Germany
Get access

Extract

An automated computer technique for the indexing of spot or transmission Kikuchi patterns from any crystal structure has been developed. The patterns are recorded from the fluorescence screen of a PHILIPS EM 430 TEM with an integrating, Peltier cooled CCD camera (PULNIX TM 86QN) through a window from outside by replacing the focusing binocular. The frame-grabber board PCLL2 (SPINDLER & HOYER) has a resolution of 8 bit which corresponds to 256 grey levels. To reduce the high range of image contrastj a circular continuous density filter is positioned directly in front of the camera lens.

Type
IV. New Developments in X-Ray Sources, Instrumentation and Techniques
Information
Advances in X-Ray Analysis , Volume 38: Forty-third Annual Conference on Applications of X-ray Analysis , 1994 , pp. 377 - 381
Copyright
Copyright © International Centre for Diffraction Data 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Schwarzer, R.A., Zaefferer, S. and Kunze, K.: Advances in X-Ray Analysis 38: thin volume Google Scholar
[2] Adams, B.L., Wright, S.I. and Kunze, K.: Metallurg. Trans. 24A: S19–831 (1993)Google Scholar
[3] Schwarzer, R.A.: Beitr. elektronenmikroskop. Direktabb. Oberfl. 18: 61–68 (1985)Google Scholar
[4] Krieger, N.C. Lassen, D. Jensen, Juul and Conradsen, K.: Scanning Microscopy 6: 115–123 (1992)Google Scholar
[5] Weiland, H. and Schwarzer, R.A.: Beitr. elektronenmikrosk. Direktabb. Oberfl. 18: 55–60 (1985)Google Scholar
[6] Schwarzer, R.A. and Weiland, H: Textures and Microstructures 8&9: 531–577 (1988)Google Scholar