Published online by Cambridge University Press: 06 March 2019
A semiconductor detector x-ray spectrometer has been constructed for the analysis of elements in air particulate specimens. The excitation radiation is provided, either directly or indirectly, using a low power (40 watts) Ag anode x-ray tube. Less than 100 ng for most of the elements in the range Mg → Zr, Pb are easily detected within two 1-minute counting intervals. A calibration technique for light element analysis and an experimental method which compensates for particle size effects will be discussed.