Crossref Citations
This Book has been
cited by the following publications. This list is generated based on data provided by Crossref.
Tang, F.
Karabacak, T.
Morrow, P.
Gaire, C.
Wang, G.-C.
and
Lu, T.-M.
2005.
Texture evolution during shadowing growth of isolated Ru columns.
Physical Review B,
Vol. 72,
Issue. 16,
Cui, Bentao
Cohen, P. I.
and
Dabiran, A. M.
2005.
Direct Measurement of Ion Beam Induced, Nanoscale Roughening of GaN.
MRS Proceedings,
Vol. 864,
Issue. ,
Zuo, Jian‐Min
2005.
Encyclopedia of Inorganic Chemistry.
Abukawa, Tadashi
Yamazaki, Tomoyuki
Yajima, Kentaro
and
Yoshimura, Koji
2006.
Weissenberg Reflection High-Energy Electron Diffraction for Surface Crystallography.
Physical Review Letters,
Vol. 97,
Issue. 24,
Tischler, J. Z.
Eres, Gyula
Larson, B. C.
Rouleau, Christopher M.
Zschack, P.
and
Lowndes, Douglas H.
2006.
Nonequilibrium Interlayer Transport in Pulsed Laser Deposition.
Physical Review Letters,
Vol. 96,
Issue. 22,
Feltrin, Andrea
and
Freundlich, Alexandre
2006.
Kinematical Analysis of the Evolution of Reflection High Energy Electron Diffraction Patterns of Quantum Dot Heterostructures: Correlation with Strain and Anisotropy.
MRS Proceedings,
Vol. 924,
Issue. ,
HORIO, Yoshimi
2006.
RHEED Kikuchi Pattern from Vicinal Surface.
Hyomen Kagaku,
Vol. 27,
Issue. 1,
p.
46.
OHNISHI, Tsuyoshi
and
LIPPMAA, Mikk
2007.
RHEED Intensity Oscillation during Oxide Thin Film Growth.
Hyomen Kagaku,
Vol. 28,
Issue. 4,
p.
223.
ABUKAWA, Tadashi
2007.
Reciprocal Space Measurement by Electron Diffractions.
Hyomen Kagaku,
Vol. 28,
Issue. 6,
p.
333.
Shin, Byungha
and
Aziz, Michael J.
2007.
Modeling RHEED intensity oscillations in multilayer epitaxy: Determination of the Ehrlich-Schwoebel barrier in Ge(001) homoepitaxy.
Physical Review B,
Vol. 76,
Issue. 16,
Manson, J. R.
Khemliche, Hocine
and
Roncin, Philippe
2008.
Theory of grazing incidence diffraction of fast atoms and molecules from surfaces.
Physical Review B,
Vol. 78,
Issue. 15,
Minami, Tomoko
Yamagata, Yuki
Nakahara, Hitoshi
and
Ichimiya, Ayahiko
2008.
Structural Analysis of Crystal Surfaces by Reflection High-Energy Electron Diffraction Patterns: The Si(111)7*7 Surface.
e-Journal of Surface Science and Nanotechnology,
Vol. 6,
Issue. ,
p.
87.
Romanyuk, O.
Kaganer, V. M.
Shayduk, R.
Tinkham, B. P.
and
Braun, W.
2008.
Staircase model of GaSb(001)(1×3)andc(2×6)phases.
Physical Review B,
Vol. 77,
Issue. 23,
Christen, H M
and
Eres, G
2008.
Recent advances in pulsed-laser deposition of complex oxides.
Journal of Physics: Condensed Matter,
Vol. 20,
Issue. 26,
p.
264005.
2008.
Nanotechnology-Enabled Sensors.
p.
135.
2008.
Handbook of Nitride Semiconductors and Devices.
p.
323.
Daumont, C J M
Mannix, D
Venkatesan, Sriram
Catalan, G
Rubi, D
Kooi, B J
De Hosson, J Th M
and
Noheda, B
2009.
Epitaxial TbMnO3thin films on SrTiO3substrates: a structural study.
Journal of Physics: Condensed Matter,
Vol. 21,
Issue. 18,
p.
182001.
Kawamura, Takaaki
and
A. Maksym, Peter
2009.
Origin of RHEED Intensity Oscillation during Growth Studied by Using Wave Functions.
Journal of the Physical Society of Japan,
Vol. 78,
Issue. 7,
p.
073601.
Cloet, V.
Feys, J.
Huhne, R.
Engel, S.
Holzapfel, B.
Hoste, S.
and
Van Driessche, I.
2009.
A Water-Based Sol-Gel Precursor for Deposition of Thin ${\rm La}_{2}{\rm Zr}_{2}{\rm O}_{7}$ Layers on Ni-W Substrates.
IEEE Transactions on Applied Superconductivity,
Vol. 19,
Issue. 3,
p.
3467.
Park, Hyuk
and
Zuo, J.M.
2009.
Implications for Ultrafast Reflection Electron Diffraction from Temporal and Spatial Evolution of Transient Electric Fields.
MRS Proceedings,
Vol. 1230,
Issue. ,