Book contents
- Frontmatter
- Contents
- Foreword
- Preface
- List of Abbreviations
- List of Symbols
- 1 Introduction
- 2 Review on Modeling Junctionless FETs
- 3 The EPFL Charge-based Model of Junctionless Field-Effect Transistors
- 4 Model-Driven Design-Space of Junctionless FETs
- 5 Generalization of the Charge-based Model: Accounting for Inversion Layers
- 6 Predicted Performances of Junctionless FETs
- 7 Short-Channel Effects in Symmetric Junctionless Double-Gate FETs
- 8 Modeling AC Operation in Symmetric Double-Gate and Nanowire JL FETs
- 9 Modeling Asymmetric Operation of Double-Gate Junctionless FETs
- 10 Modeling Noise Behavior in Junctionless FETs
- 11 Carrier Mobility Extraction Methodology in JL and Inversion-Mode FETs
- 12 Revisiting the Junction FET: A Junctionless FET with an ∞ Gate Capacitance
- 13 Modeling Junctionless FET with Interface Traps Targeting Biosensor Applications
- Appendix A Design-Space of Twin-Gate Junctionless Vertical Slit FETs
- Appendix B Transient Off-Current in Junctionless FETs
- Appendix C Derivatives of Mobile Charge Density with Respect to V GS and V DS
- Appendix D Global Charge Density at Drain in Depletion Mode
- Appendix E Global Charge Density at Drain in Accumulation Mode
- Appendix F The EPFL Junctionless MODEL
- References
- Index
12 - Revisiting the Junction FET: A Junctionless FET with an ∞ Gate Capacitance
Published online by Cambridge University Press: 24 February 2018
- Frontmatter
- Contents
- Foreword
- Preface
- List of Abbreviations
- List of Symbols
- 1 Introduction
- 2 Review on Modeling Junctionless FETs
- 3 The EPFL Charge-based Model of Junctionless Field-Effect Transistors
- 4 Model-Driven Design-Space of Junctionless FETs
- 5 Generalization of the Charge-based Model: Accounting for Inversion Layers
- 6 Predicted Performances of Junctionless FETs
- 7 Short-Channel Effects in Symmetric Junctionless Double-Gate FETs
- 8 Modeling AC Operation in Symmetric Double-Gate and Nanowire JL FETs
- 9 Modeling Asymmetric Operation of Double-Gate Junctionless FETs
- 10 Modeling Noise Behavior in Junctionless FETs
- 11 Carrier Mobility Extraction Methodology in JL and Inversion-Mode FETs
- 12 Revisiting the Junction FET: A Junctionless FET with an ∞ Gate Capacitance
- 13 Modeling Junctionless FET with Interface Traps Targeting Biosensor Applications
- Appendix A Design-Space of Twin-Gate Junctionless Vertical Slit FETs
- Appendix B Transient Off-Current in Junctionless FETs
- Appendix C Derivatives of Mobile Charge Density with Respect to V GS and V DS
- Appendix D Global Charge Density at Drain in Depletion Mode
- Appendix E Global Charge Density at Drain in Accumulation Mode
- Appendix F The EPFL Junctionless MODEL
- References
- Index
Summary
The junction field-effect transistor (JFET, also called the JUGFET or junction unipolar gate FET) is the first field-effect device produced before being supplanted by the MOSFET. Even today though its use is limited, the JFET is still used in specific low-noise applications and in new applications in power electronics with new architectures and new materials (e.g., SiC). Just like the junctionless FET biased below the flat-band, the JFET operates in depletion and the current flows in the volume, not at an interface. However, unlike the junctionless FET, the JFET has no gate-insulator layer i.e., there is no semiconductor-insulator interface. This could result in low-frequency noise, which mainly originates from interface traps, and is a clear advantage. Similarly, surface-roughness scattering [183], which degrades mobility, is alleviated to a great extent.
Despite the long use of JFETs in discrete electronics, physics-based compact models today still adopt a conservative approach and deal with the so-called fulldepletion approximation where the deep-depletion regime is essentially modeled empirically. Today, FET compact models [183–186] use regional approximations bridged with smoothing functions. For instance, Sansen and Das [184] adopted a MOSFET-like approach to interpolate the subthreshold, quadratic, and linear modes of operation. Semiempirical log-exponential functions have also been introduced to ensure a smooth transition across the pinch-off domain [184], a technique also used in [187, 188].
This chapter discusses a unified charge-based model for double-gate JFETs addressing fundamental DC, AC, and noise characteristics. The central element considers the JFET as a junctionless FET with a negligible insulating layer i.e., a junctionless FET with an infinite gate capacitance. As for the double-gate junctionless FET, the physics-based model for the JFET will cover all regions of operation, with the exception of accumulation, which is not compatible with the device architecture (forward-biasing of the gate-to-channel pn junctions).
Principle Operation of the JFET
Like the junctionless FET, the JFET has no source and drain pn junction and the channel consists of a highly doped semiconductor layer. However, a major difference exists between these two devices: whereas the junctionless FET has an insulating layer between the channel and the gate electrode(s), in JFETs this role is played by a reversed biased gate-to-channel pn junction i.e., the gate is highly doped to avoid depletion into the gate.
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- Publisher: Cambridge University PressPrint publication year: 2018