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The Cambridge RF and Microwave Engineering Series

Published online by Cambridge University Press:  21 September 2017

T. Mitch Wallis  and
Pavel Kabos
T. Mitch Wallis
Affiliation:
National Institute of Standards and Technology, Boulder
Pavel Kabos
Affiliation:
National Institute of Standards and Technology, Boulder
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Measurement Techniques for Radio Frequency Nanoelectronics , pp. i - vi
Publisher: Cambridge University Press
Print publication year: 2017

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References

Aaen, Peter, Plá, Jaime, and Wood, John, Modeling and Characterization of RF and Microwave Power FETsGoogle Scholar
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Wallis, T. Mitch and Kabos, Pavel, Measurement Techniques for Radio Frequency NanoelectronicsGoogle Scholar

Forthcoming

Carter, Richard, Microwave and RF Vacuum Electronic Power SourcesGoogle Scholar
José Carlos Pedro, , David Root, , Jianjun Xu, , and Nunes, Luis Cótimos, Nonlinear Circuit Simulation and ModelingGoogle Scholar
Ghione, Giovanni and Pirola, Marco, Microwave ElectronicsGoogle Scholar
Schröter, Michael and Claus, Martin, Carbon Nanotube Electronics for Analog Radio-Frequency ApplicationsGoogle Scholar

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