A simple, widely applicable method is described for determining factorial moments of N̂t, the number of occurrences in (0,t] of some event defined in terms of an underlying Markov renewal process, and asymptotic expressions for these moments as t → ∞. The factorial moment formulae combine to yield an expression for the probability generating function of N̂t, and thereby further properties of such counts. The method is developed by considering counting processes associated with events that are determined by the states at two successive renewals of a Markov renewal process, for which it both simplifies and generalises existing results. More explicit results are given in the case of an underlying continuous-time Markov chain. The method is used to provide novel, probabilistically illuminating solutions to some problems arising in the stochastic modelling of ion channels.

Patch clamp recordings from ion channels often show periods of repetitive activity, known as bursts, which are noticeably separated from each other by periods of inactivity. Depending on the type of channel, such recordings may exhibit (conductance) levels between the closed (zero) level and the fully open level. Properties of bursts are less subject to problems that arise from recording than are properties for individual sojourns at different levels, and study of bursting behaviour provides important information about the finer structure of the underlying channel gating process. For a general finite state space continuous-time Markov chain model allowing one or more nonzero conductance levels, the present paper establishes results about the semi-Markov structure of a single burst and of a sequence of bursts, and uses this in a unified approach to properties of both theoretical and empirical bursts. The distribution and moments of particular burst properties, including the total charge transfer, the total sojourn time and the total number of visits to specified conductance levels during a burst, are derived. Various extensions are also described.

Consider a system of interacting finite Markov chains in continuous time, where each subsystem is aggregated by a common partitioning of the state space. The interaction is assumed to arise from dependence of some of the transition rates for a given subsystem at a specified time on the states of the other subsystems at that time. With two subsystem classes, labelled 0 and 1, the superposition process arising from a system counts the number of subsystems in the latter class. Key structure and results from the theory of aggregated Markov processes are summarized. These are then applied also to superposition processes. In particular, we consider invariant distributions for the level m entry process, marginal and joint distributions for sojourn-times of the superposition process at its various levels, and moments and correlation functions associated with these distributions. The distributions are obtained mainly by using matrix methods, though an approach based on point process methods and conditional probability arguments is outlined. Conditions under which an interacting aggregated Markov chain is reversible are established. The ideas are illustrated with simple examples for which numerical results are obtained using Matlab. Motivation for this study has come from stochastic modelling of the behaviour of ion channels; another application is in reliability modelling.

We consider lumpability for continuous-time Markov chains and provide a simple probabilistic proof of necessary and sufficient conditions for strong lumpability, valid in circumstances not covered by known theory. We also consider the following marginalisability problem. Let {X{t)} = {(X1(t), X2(t), · ··, Xm(t))} be a continuous-time Markov chain. Under what conditions are the marginal processes {X1(t)}, {X2(t)}, · ··, {Xm(t)} also continuous-time Markov chains? We show that this is related to lumpability and, if no two of the marginal processes can jump simultaneously, then they are continuous-time Markov chains if and only if they are mutually independent. Applications to ion channel modelling and birth–death processes are discussed briefly.