18 results
A Method for High-Resolution Three-Dimensional Reconstruction with Ewald Sphere Curvature Correction from Transmission Electron Images
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- Microscopy and Microanalysis / Volume 28 / Issue 5 / October 2022
- Published online by Cambridge University Press:
- 29 April 2022, pp. 1550-1566
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- October 2022
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Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets
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- Microscopy and Microanalysis / Volume 28 / Issue 3 / June 2022
- Published online by Cambridge University Press:
- 09 March 2022, pp. 622-632
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- June 2022
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Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 27 / Issue 5 / October 2021
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- 20 August 2021, pp. 943-995
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- October 2021
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Three-Dimensional Atomically Resolved Analytical Imaging with a Field Ion Microscope
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- Microscopy and Microanalysis / Volume 28 / Issue 4 / August 2022
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- 06 August 2021, pp. 1264-1279
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- August 2022
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Ultra-Microtome for the Preparation of TEM Specimens from Battery Cathodes
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- Microscopy and Microanalysis / Volume 26 / Issue 5 / October 2020
- Published online by Cambridge University Press:
- 01 September 2020, pp. 867-877
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- October 2020
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Virtual Scanning Tunneling Microscope Offered as a Free-Download
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- Microscopy Today / Volume 26 / Issue 3 / May 2018
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- 08 May 2018, pp. 18-23
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- May 2018
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Automated Atom-By-Atom Three-Dimensional (3D) Reconstruction of Field Ion Microscopy Data
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- Microscopy and Microanalysis / Volume 23 / Issue 2 / April 2017
- Published online by Cambridge University Press:
- 20 March 2017, pp. 255-268
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- April 2017
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Atom Column Indexing: Atomic Resolution Image Analysis Through a Matrix Representation
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- Microscopy and Microanalysis / Volume 20 / Issue 6 / December 2014
- Published online by Cambridge University Press:
- 17 November 2014, pp. 1764-1771
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- December 2014
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A New Silicon Drift Detector for High Spatial Resolution STEM-XEDS: Performance and Applications
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- Microscopy and Microanalysis / Volume 20 / Issue 4 / August 2014
- Published online by Cambridge University Press:
- 29 July 2014, pp. 1046-1052
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- August 2014
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Atomic-Scale Imaging and Spectroscopy for In Situ Liquid Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 18 / Issue 3 / June 2012
- Published online by Cambridge University Press:
- 02 May 2012, pp. 621-627
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- June 2012
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Aberration Correction and Electron Holography
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- Microscopy and Microanalysis / Volume 16 / Issue 4 / August 2010
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- 05 July 2010, pp. 434-440
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- August 2010
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The Contributions of Otto Scherzer (1909–1982) to the Development of the Electron Microscope
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- Microscopy and Microanalysis / Volume 16 / Issue 4 / August 2010
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- 22 June 2010, pp. 366-374
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- August 2010
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Aberration-Corrected STEM Imaging of Ag on γ-Al2O3
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- Microscopy and Microanalysis / Volume 14 / Issue 1 / February 2008
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- 21 December 2007, pp. 98-103
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- February 2008
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Early Results from an Aberration-Corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory
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- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
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- 11 October 2006, pp. 483-491
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- December 2006
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Physical Limits on Atomic Resolution
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- Microscopy and Microanalysis / Volume 10 / Issue 1 / February 2004
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- 22 January 2004, pp. 153-157
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- February 2004
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In Situ Real-time Environmental High Resolution Electron Microscopy of Nanometer Size Novel Xerogel Catalysts for Hydrogenation Reactions in Nylon 6,6
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- Microscopy and Microanalysis / Volume 6 / Issue 4 / July 2000
- Published online by Cambridge University Press:
- 07 August 2002, pp. 335-342
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- July 2000
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Centrosymmetric bilayers in the 0.75 Å resolution structure of a designed alpha-helical peptide, d,l-Alpha-1
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- Protein Science / Volume 8 / Issue 7 / July 1999
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- 01 July 1999, pp. 1410-1422
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- July 1999
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Packed protein bilayers in the 0.90 Å resolution structure of a designed alpha helical bundle
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- Protein Science / Volume 8 / Issue 7 / July 1999
- Published online by Cambridge University Press:
- 01 July 1999, pp. 1400-1409
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- July 1999
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