Passive millimeter-wave imaging systems (PMWIS) are employed for detecting concealed objects by mapping millimeter waves emitted from materials or living tissues. The emitted waves are measured by a receiver or radiometers without employing external wave sources. In this paper, a new super-heterodyne receiver front-end of a PMWIS at 35 GHz with an even order band pass filter is simulated and implemented. The receiver has a suitable temperature resolution for the use of hidden object imaging, is integrated and lightweight assembled on one-layer board. It has a bandwidth of 1.5 GHz, a noise figure (NF) of 2.2, and a temperature resolution of 0.126 K. The even order filter is implemented based on the substrate-integrated waveguide (SIW) technology, with Chebyshev response. The filters are designed at the central frequency of 35 GHz with the bandwidth of 1.5 GHz and one of them has controllable transmission zeroes. The filters are made by printed circuit board technology, employing SIW as resonators, having a high-quality factor of 23.33. Additionally, a triple-stage radio frequency (RF) low noise amplifier has been implemented having the specification of: RF 34.25–35.75 GHz; bandwidth 1.5 GHz; gain >60 dB; NF <2.3 dB, which are better indexes compared to some other works.

The crystallographic analysis of nanoscale phases with dimensions well below the spatial probing volume of electron backscatter diffraction (EBSD) traditionally rely on electron microscopy in transmission (either in SEM or TEM), because EBSD patterns are invariably dominated by the matrix phase contribution and present seemingly no trace from such nanoscale phases. Yet, this study shows that such nanoscale features generate a very faint but valuable secondary diffraction signal which can be retrieved. A diffraction pattern postprocessing method is presented which focuses on the detection of such secondary signal emitted by nanoscale minority phases in overlapped patterns dominated by a dominant matrix signal. The predominant, majority phase contribution in EBSD patterns is removed by a close-neighbor pattern subtraction routine, after which both the conventional Hough indexing method as well as pattern matching methods can be used to reveal the crystallography, spatial distribution, morphology, and orientation of nanoscale minority phases initially absent from EBSD maps. Nanolamellar pearlitic steel, which has long been out of reach for EBSD, has been chosen as an application example.

Determining spatial resolution from images is crucial when optimizing focus, determining smallest resolvable object, and assessing size measurement uncertainties. However, no standard algorithm exists to measure resolution from electron microscopy (EM) images, though several have been proposed, where most require user decisions. We present the Spatial Image Resolution Assessment by Fourier analysis (SIRAF) algorithm that uses fast Fourier transform analysis to estimate resolution directly from a single image without user inputs. The method is derived from the underlying assumption that objects display intensity transitions, resembling a step function blurred by a Gaussian point spread function. This hypothesis is tested and verified on simulated EM images with known resolution. To identify potential pitfalls, the algorithm is also tested on simulated images with a variety of settings, and on real SEM images acquired at different magnification and defocus settings. Finally, the versatility of the method is investigated by assessing resolution in images from several microscopy techniques. It is concluded that the algorithm can assess resolution from a large selection of image types, thereby providing a measure of this fundamental image parameter. It may also improve autofocus methods and guide the optimization of magnification settings when balancing spatial resolution and field of view.

Nanowire-based nanocomposite materials are being developed as transparent and flexible electrodes or as stretchable conductors and dielectrics for biosensing. Here, we theoretically investigate the use of scanning dielectric microscopy (SDM) to characterize these materials in a nondestructive way, with a special focus on the achievable spatial resolution and the possibility of detection of the capacitive coupling between nearby nanowires. Numerical calculations with models involving single and multiple buried nanowires have been performed. We demonstrate that the capacitance gradient spread function of a single buried nanowire consists of a modified Lorenzianan with a cubic decay. We show that the achievable spatial resolution can be determined with good accuracy with the help of this spread function. It is shown that, in general, the spatial resolution worsens when any system parameter decreases the maximum of the nanowire spread function or increases its width, or both. Finally, we show that SDM measurements are also sensitive to the capacitive coupling between nearby nanowires. This latter result is of utmost relevance since the macroscopic electric properties of nanowire nanocomposites largely depend on the electric interaction between nearby nanowires. The present results show that SDM can be a valuable nondestructive subsurface characterization technique for nanowire nanocomposite materials.

Leafy spurge, a noxious perennial weed, is a major threat to the prairie ecosystem in North America. Strategic planning to control leafy spurge requires monitoring its spatial distribution and spread. The ability to detect flowering leafy spurge at two biological control sites in southern Saskatchewan, Canada, was investigated using an unmanned aerial vehicle (UAV) system. Three flight missions were conducted on June 30, 2016, during the leafy spurge flowering period. Imagery was acquired at four flight heights and one or two acquisition times, depending on the site. The sites were reflown on June 28, 2017, to evaluate the change in flowering leafy spurge over time. Mixture tuned matched filtering (MTMF) and hue, intensity, and saturation (HIS) threshold analyses were used to determine flowering leafy spurge cover. Flight height of 30 m was optimal; the strongest relationships between UAV and ground estimates of leafy spurge cover (r2 = 0.76 to 0.90; normalized root mean square error [NRMSE] = 0.10 to 0.13) and stem density (r2 = 0.72 to 0.75) were observed. Detection was not significantly affected by the image analysis method (P > 0.05). Flowering leafy spurge cover estimates were similar using HIS (1.9% to 14.8%) and MTMF (2.1% to 10.3%) and agreed with the ground estimates (using HIS: r2 = 0.64 to 0.93, NRMSE = 0.08 to 0.25; using MTMF: r2 = 0.64 to 0.90, NRMSE = 0.10 to 0.27). The reduction in flowering leafy spurge cover between 2016 and 2017 detected using UAV images and HIS (8.1% at site 1 and 2.7% at site 2) was consistent with that based on ground digital photographs (10% at site 1 and 1.8% at site 2). UAV imagery is a useful tool for accurately detecting flowering leafy spurge and could be used for routine monitoring purposes in a biological control program.

Microchip technology with electron transparent membranes is a key component for in situ liquid transmission electron microscope (TEM) characterization. The membranes can significantly influence the TEM imaging spatial resolution, not only due to introducing additional material layers but also due to the associated bulging. The membrane bulging is largely defined by the membrane materials, thickness, and short dimension. The impact of the membrane on the spatial resolution, especially the extent of its bulging, was systematically investigated through the impact on the signal-to-noise ratio, chromatic aberration, and beam broadening. The optimization of the membrane parameters is the key component when designing the in situ TEM liquid cell. The optimal membrane thickness of 50 nm was found which balances the impact of membrane bulging and membrane thickness. Beyond this, the short membrane window dimension and the chip nominal spacing should be minimized. However, these two parameters have practical limitations in regards to chip handling.

Proton radiography is used for advanced hydrotesting as a new type radiography technology due to its powerful penetration capability and high detection efficiency. A new proton radiography terminal will be developed to radiograph static samples at the Institute of Modern Physics of Chinese Academy of Science. The proton beam with the maximum energy of 2.6 GeV will be produced by Heavy Ion Research Facility in Lanzhou-Cooling Storage Ring. The proton radiography terminal consists of the matching magnetic lens and the Zumbro lens system. In this paper, the design scheme and all optic parameters of this beam terminal for 2.6 GeV proton energy are presented by simulating the beam optics using WINAGILE code. My-BOC code is used to test the particle tracking of proton radiography beam line. Geant4 and G4beamline codes are used for simulating the proton radiography system. The results show that the transmission efficiency of proton without target is 100%, and the effect of secondary particles can be neglected. To test this proton radiography system, the proton images for an aluminum plate sample with two rectangular orifices and a step brass plate sample are respectively simulated using Geant4 code. The results show that the best spatial resolution is about 36 μm, and the differences of the thickness are not >10%.

The effect of carbon contamination on the analysis of carbon-coated silicate minerals at 5 kV for X-ray energies 0.7–4 keV is examined. For individual spot analyses, carbon is found to deposit adjacent to the beam spot forming ring-shaped deposits with no impact on the analysis. Carbon contamination becomes important for closely spaced analyses such as multipoint transects, where each subsequent analysis overlaps the carbon ring of the previous analysis. X-ray intensity loss due to contamination is most severe for low-overvoltage elements such as Ca K consistent with carbon deposition effectively reducing beam energy. Rates of contamination are calculated and the use of a liquid nitrogen cold trap is shown to greatly reduce the amount of carbon deposited. A complimentary empirical correction is developed to correct for X-ray intensity loss from measured carbon, assuming the carbon is a film, and is compared with corrections derived from thin film calculations. PENELOPE electron probe microanalysis (PENEPMA) calculations confirm that asymmetry of the carbon deposition can be ignored for X-ray energies where intensity loss is predominantly through energy loss of beam electrons. Using a cold trap and/or an empirical correction high spatial resolution analysis (ca. 400 nm between points) is achievable with analytical errors of ca. 1–3%.

This paper is about the precision performance evaluation of an XY-theta platform, with a patented kinematic design. Indeed, this platform is held by a serial redundant robot arm actuated with four revolute joints. The platform offers a wide 300 × 300 mm workspace, whereas the whole mechanism is extremely compact. Any workpiece on the platform can be positioned under a vertical axis to be grasped or manufactured in a two-step approach: in a coarse positioning mode, the four revolute joints are controlled to position and orientate the workpiece with a position error of less than 10 μm; in a fine positioning mode, two revolute joints are mechanically blocked while two others are controlled to reduce the final error to below 2 μm. The mechanism design and the choice of the blocked and moving joints are optimized to enhance the positioning performances in the two-step positioning method. In this paper, the platform positioning repeatability and its spatial resolution are characterized with the help of a camera. The advantage of this method is that it avoids any mechanical contact and can be implemented easily. Then, these results are compared to our previous precision performance evaluation obtained with the stationary cube method. Finally, the positioning repeatability is estimated at 6.5 μm in the coarse positioning mode and 1.4 μm in the fine positioning mode. Between the coarse and fine mode, the repeatability is thus improved by the factor of four, as predicted by the theory.

A procedure has been developed to follow degradation of energy-dispersive spectroscopy (EDS) X-ray lateral resolution in a variable pressure scanning electron microscope. This procedure is based on evaluation of the EDS profile shape change for different experimental conditions. Some parameters affecting the X-ray resolution in high-vacuum mode have been taken into account. Good agreement between the simulated and experimental EDS profiles shows the reliability of the proposed procedure. A significant improvement in measurement of the EDS profile interfacial distance (DINT) has been achieved.

In this study, bicrystals of silver (Ag) and aluminum (Al) were used to investigate the physical spatial resolution of the electron backscatter diffraction system combining a digital image correlation method. Furthermore, the effect of the accelerating voltage and probe current was investigated on the physical spatial resolution of the lateral and longitudinal resolutions for Ag and Al, respectively. The lateral and longitudinal resolutions show high dependency on the accelerating voltage for a low atomic mass material of Al, In addition, these are almost independent of the accelerating voltage for a high atomic mass material of Ag. Moreover, the probe current does not play any role on both the lateral and longitudinal resolutions. The best lateral resolutions for Al and Ag are 40.5 and 12.1 nm at 10 kV and 1 nA, respectively. The best longitudinal resolutions of 23.2 and 80 nm were obtained at 10 kV and 1 nA for Al and Ag, respectively.

Electron backscatter diffraction (EBSD) and electron probe microanalysis (EPMA) measurements are combined to characterize an industrial produced dual-phase steel containing some bainite fraction. High-resolution carbon mappings acquired on a field emission electron microprobe are utilized to validate and improve the identification of the constituents (ferrite, martensite, and bainite) performed by EBSD using the image quality and kernel average misorientation. The combination eliminates the ambiguity between the identification of bainite and transformation-induced dislocation zones, encountered if only the kernel average misorientation is considered. The detection of carbon in high misorientation regions confirms the presence of bainite. These results are corroborated by secondary electron images after nital etching. Limitations of this combined method due to differences between the spatial resolution of EBSD and EPMA are assessed. Moreover, a quantification procedure adapted to carbon analysis is presented and used to measure the carbon concentration in martensite and bainite on a submicrometer scale. From measurements on reference materials, this method gives an accuracy of 0.02 wt% C and a precision better than 0.05 wt% C despite unavoidable effects of hydrocarbon contamination.

Transmission electron microscopy (TEM) in combination with electron tomography is widely used to obtain nanometer scale three-dimensional (3D) structural information about biological samples. However, studies of whole eukaryotic cells are limited in resolution and/or contrast on account of the effect of chromatic aberration of the TEM objective lens on electrons that have been scattered inelastically in the specimen. As a result, 3D information is usually obtained from sections and not from whole cells. Here, we use chromatic aberration-corrected TEM to record bright-field TEM images of nanoparticles in a whole mount macrophage cell. Tilt series of images are used to generate electron tomograms, which are analyzed to assess the spatial resolution that can be achieved for different vertical positions in the specimen. The uptake of gold nanoparticles coated with low-density lipoprotein (LDL) is studied. The LDL is found to assemble in clusters. The clusters contain nanoparticles taken up on different days, which are joined without mixing their nanoparticle cargo.

Contrast-modulated (CM) stimuli are processed by spatial mechanisms that operate at larger spatial scales than those processing luminance-modulated (LM) stimuli and may be more prone to deficits in developing, amblyopic, and aging visual systems. Understanding neural mechanisms of contour interaction or crowding will help in detecting disorders of spatial vision. In this study, contour interaction effects on visual acuity for LM and CM C and bar stimuli are assessed in normal foveal vision. In Experiment 1, visual acuity is measured for all-LM and all-CM stimuli, at ∼3.5× above their respective modulation thresholds. In Experiment 2, visual acuity is measured for Cs and bars of different type (LM C with CM bars and vice versa). Visual acuity is degraded for CM compared with LM Cs (0.46 ± 0.04 logMAR vs. 0.18 ± 0.04 logMAR). With nearby bars, CM acuity is degraded further (0.23 ± 0.01 logMAR or ∼2 lines on an acuity chart), significantly more than LM acuity (0.11 ± 0.01 logMAR, ∼1 line). Contour interaction for CM stimuli extends over greater distances (arcmin) than it does for LM stimuli, but extents are similar with respect to acuities (∼3.5× the C gap width). Contour interaction is evident when the Cs and bars are defined differently: it is stronger when an LM C is flanked by CM bars (0.17 ± 0.03 logMAR) than when a CM C is flanked by LM bars (0.08 ± 0.02 logMAR). Our results suggest that contour interaction for foveally viewed acuity stimuli involves feature integration, such that the outputs of receptive fields representing Cs and bars are combined. Contour interaction operates at LM and CM representational stages, it can occur across stage, and it is enhanced at the CM stage. Greater contour interaction for CM Cs and bars could hold value for visual acuity testing and earlier diagnosis of conditions for which crowding is important, such as in amblyopia.

This article reviews different methods used to perform quantitative X-ray microanalysis in the electron microscope and also demonstrates the urgency of measuring the fundamental parameters of X-ray generation for the development of accurate standardless quantitative methods. Using ratios of characteristic lines acquired on the same X-ray spectrum, it is shown that the Cliff and Lorimer KA-B factor can be used in a general correction method that is appropriate for all types of specimens and electron microscopes, providing that appropriate corrections are made for X-ray absorption, fluorescence, and indirect generation. Since the fundamental parameters appear in the KA-B factor, only the ratio of the ionization cross sections needs to be known, not their absolute values. In this regard, the measurement of ratios of the KA-B factor (or intensities at different beam energies of the same material with no change of beam spreading in the material) permits the validation for the best models to compute the ratio of ionization cross sections. It is shown, using this method, that the nonrelativistic Bethe equation, to compute ionization cross section, is very close to the equation of E. Casnati et al. (J Phys B15, 155–167, 1982) and also to the equations proposed by D. Bote and F. Salvat (Phys Rev A77, 042701, 2008) for the computation of the ratio of ionization cross sections. The method is extended to show that it could be used to determine the values of the Coster-Kronig transitions factors, an important fundamental parameter for the generation of L and M lines that is mostly known with poor accuracy. The detector efficiency can be measured with specimens where their intensities were measured with an energy dispersive spectrometer detector, the efficiency of which has been measured in an X-ray synchrotron (M. Alvisi et al., Microsc Microanal12, 406–415, 2006). The spatial resolution should always be computed when performing quantitative X-ray microanalysis and the equations of R. Gauvin (Microsc Microanal13(5), 354–357, 2007) for bulk materials and the one presented in this article for thin films should be used. The effects of X-rays generated by fast secondary electrons and by Auger electrons are reviewed, and their effect can be detrimental for the spatial resolution of materials involving low-energy X-ray lines, in certain specific conditions. Finally, quantitative X-ray microanalysis of heterogeneous materials is briefly reviewed.

The relation between probe size and spatial resolution of backscattered electron (BSE) images was studied. In addition, the effect of the accelerating voltage, the current intensity and the sample geometry and composition were analyzed. An image synthesis method was developed to generate the images from backscattered electron coefficients obtained from Monte Carlo simulations. Spatial resolutions of simulated images were determined with the SMART-J method, which is based on the Fourier transform of the image. The resolution can be improved by either increasing the signal or decreasing the noise of the backscattered electron image. The analyses demonstrate that using a probe size smaller than the size of the observed object (sample features) does not improve the spatial resolution. For a probe size larger than the feature size, the spatial resolution is proportional to the probe size.