In situ transmission electron microscopy (TEM) has become an
increasingly important tool for materials characterization. It provides key
information on the structural dynamics of a material during transformations and
the ability to correlate a material’s structure and properties. With
the recent advances in instrumentation, including aberration-corrected optics,
sample environment control, the sample stage, and fast and sensitive data
acquisition, in situ TEM characterization has become more
powerful. In this article, a brief review of the current status and future
opportunities of in situ TEM is provided. The article also
introduces the six articles in this issue of MRS Bulletin
exploring the frontiers of in situ electron microscopy,
including liquid and gas environmental TEM, dynamic four-dimensional TEM,
studies on nanomechanics and ferroelectric domain switching, and
state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and
individual defects.