9 results
Thickness and Stacking Sequence Determination of Exfoliated Dichalcogenides (1T-TaS2, 2H-MoS2) Using Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue 4 / August 2018
- Published online by Cambridge University Press:
- 03 September 2018, pp. 387-395
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- August 2018
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Structure analysis of montmorillonite crystallites by convergent-beam electron diffraction
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- Journal:
- Clay Minerals / Volume 40 / Issue 1 / March 2005
- Published online by Cambridge University Press:
- 09 July 2018, pp. 1-13
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Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue 5 / October 2012
- Published online by Cambridge University Press:
- 02 October 2012, pp. 995-1009
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- October 2012
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The Focused Ion Beam Fold-Out: Sample Preparation Method for Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue 6 / December 2009
- Published online by Cambridge University Press:
- 06 October 2009, pp. 558-563
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- December 2009
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FFT Multislice Method—The Silver Anniversary
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue 1 / February 2004
- Published online by Cambridge University Press:
- 22 January 2004, pp. 34-40
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- February 2004
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Analysis of Local Strain in Aluminum Interconnects by Convergent Beam Electron Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue 5 / October 2003
- Published online by Cambridge University Press:
- 16 September 2003, pp. 390-398
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- October 2003
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On the Consistency of QCBED Structure Factor Measurements for TiO2 (Rutile)
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- Microscopy and Microanalysis / Volume 9 / Issue 5 / October 2003
- Published online by Cambridge University Press:
- 16 September 2003, pp. 457-467
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- October 2003
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Low-Dose, Low-Temperature Convergent-Beam Electron Diffraction and Multiwavelength Analysis of Hydrocarbon Films by Electron Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue 5 / October 2003
- Published online by Cambridge University Press:
- 16 September 2003, pp. 428-441
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- October 2003
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Strain Analysis of Si by FEM and Energy-Filtering CBED
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue 1 / February 2002
- Published online by Cambridge University Press:
- 28 March 2002, pp. 11-15
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- February 2002
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