19 results
First branchial arch abnormality: diagnostic dilemma and excision with facial nerve preservation
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- Journal:
- The Journal of Laryngology & Otology / Volume 126 / Issue 9 / September 2012
- Published online by Cambridge University Press:
- 12 July 2012, pp. 918-922
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- September 2012
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Metalorganic Chemical Vapor Deposition of Non-polar III-Nitride Films over a-plane SiC Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 831 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, E2.9
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- 2004
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Thermal stress as the major factor of defect generation in SiC during PVT growth
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- Journal:
- MRS Online Proceedings Library Archive / Volume 742 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, K2.18
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- 2002
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Surface Evaluation of 6H-SiC after Doping by Diffusion
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- Journal:
- MRS Online Proceedings Library Archive / Volume 680 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, E5.10
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- 2001
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Dislocation Content of Etch Pits in Hexagonal Silicon Carbide
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- Journal:
- MRS Online Proceedings Library Archive / Volume 640 / 2000
- Published online by Cambridge University Press:
- 21 March 2011, H5.4
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- 2000
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Comparison of Current – Voltage Characteristics of N and P Type 6H-SiC Schottky Diodes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 640 / 2000
- Published online by Cambridge University Press:
- 21 March 2011, H5.21
- Print publication:
- 2000
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Selective Doping of 4H-SiC by Aluminum/Boron Co-diffusion
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- Journal:
- MRS Online Proceedings Library Archive / Volume 640 / 2000
- Published online by Cambridge University Press:
- 21 March 2011, H6.9
- Print publication:
- 2000
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Thick Oxide Layers on N and P SiC Wafers by a Depo-Conversion Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 57
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- 1999
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High Voltage Schottky Barrier Diodes on P-Type SiC using Metal-Overlap on a Thick Oxide Layer as Edge Termination
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 75
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- 1999
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Correlation Between Oxide Breakdown And Defects In Sic Wafers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 512 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 351
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- 1998
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Comparison of High Field Characteristics of SiO2 and AIN Gate Insulators in 6H SiC MOS Capacitors
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- Journal:
- MRS Online Proceedings Library Archive / Volume 512 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 345
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- 1998
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Bulk Breakdown in AlGaN/GaN HFETs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 512 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 309
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- 1998
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The Response of High Voltage 4H-SiC P-N Junction Diodes to Different Edge Termination Techniques
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- Journal:
- MRS Online Proceedings Library Archive / Volume 512 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 101
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- 1998
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A Technique For Rapid Thick Film Sic Epitaxial Growth
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- Journal:
- MRS Online Proceedings Library Archive / Volume 483 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 123
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- 1997
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SiC Epitaxial Growth on Carbon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 483 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 129
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- 1997
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Power Limitation Due To Premature Breakdown In Algan/Gan Hfets
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- Journal:
- MRS Online Proceedings Library Archive / Volume 483 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 77
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- 1997
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High Electric Field Breakdown of 4H-SiC PN Junction Diodes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 423 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 111
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- 1996
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Characterization of 4H-SiC MOS Capacitors by a Fast-Ramp Response Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 423 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 99
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- 1996
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Imaging Of Micropipes In Silicon Carbide Under High Field Stress
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- Journal:
- MRS Online Proceedings Library Archive / Volume 442 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 643
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- 1996
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