16 results
On the Detection Limits of Li K X-rays Using Windowless Energy Dispersive Spectrometer (EDS)
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2024-2025
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- July 2017
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Development of Quantitative Techniques with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for Li Characterization in High Energy Batteries.
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2088-2089
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- July 2017
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Towards Li Quantification at High Spatial Resolution Using EDS
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 84-85
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- July 2016
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Direct and Indirect Observation of Lithium in a Scanning Electron Microscope; Not Only on Pure Li!
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 2357-2358
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- August 2015
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Towards A More Quantitative Measurement of the Deformation During Metallographic Specimen Preparation Using EBSD and FIB
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 700-701
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- July 2010
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Microscopic study of intermetallic compound formation by in situ method
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- The European Physical Journal - Applied Physics / Volume 49 / Issue 2 / February 2010
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- 22 December 2009, 22905
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- February 2010
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Development of Tools to Increase the Spatial Resolution of EBSD Maps
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 422-423
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- July 2009
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Quantitative Evaluation of Metallographic Preparation Quality using EBSD
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 778-779
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- July 2009
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Metallographic Sectioning and Grinding Damage Analysis Through the Use of Color Metallography and Electron Backscatter Diffraction (EBSD)
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 58-59
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- July 2009
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Evaluation of Strategies to Increase the Spatial Resolution of X-Ray Mapping in the FE-SEM of Low Concentration in Sub-Micron microstructures
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 480-481
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- July 2009
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On the Precision of EDS Analysis with Sample Tilted at 70°
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1100-1101
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- August 2008
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Evaluation of the SEM-EBSD System Stability and Hydrocarbon Contamination Effects on EBSD Band Contrast Response.
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 946-947
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- August 2007
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Comparison of K-ratios from Monte Carlo Codes and Experimental Data and Evaluation of the Effect of X-Ray Fluorescence Emission on the K-ratios
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1396-1397
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- August 2007
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Qualitative Evaluation of EBSD Technique for the Study of Plastic Deformation
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 910-911
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- August 2006
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Quantitative Film Thickness Measurement Using Scintillator/Photomultiplier Backscattered Electron Detectors. Possible or Not?
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 772-773
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- August 2005
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Visualizing Sub-Micron Burried Metal Line in VLSI Devices using a SEM
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- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
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- 02 July 2020, pp. 499-500
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- August 1997
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