Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-28T08:52:06.782Z Has data issue: false hasContentIssue false
  • English
  • Français

Development of Quantitative Techniques with Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for Li Characterization in High Energy Batteries.

Published online by Cambridge University Press:  04 August 2017

S. Bessette ,
P. Hovington ,
C. Kim ,
R. Gauvin ,
H. Demers  and
K. Zaghib
S. Bessette
Affiliation:
Hydro-Quebec’s Research Institute, Varennes, Quebec, Canada. Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
P. Hovington
Affiliation:
Hydro-Quebec’s Research Institute, Varennes, Quebec, Canada.
C. Kim
Affiliation:
Hydro-Quebec’s Research Institute, Varennes, Quebec, Canada.
R. Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
H. Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
K. Zaghib
Affiliation:
Hydro-Quebec’s Research Institute, Varennes, Quebec, Canada.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2088 - 2089
Copyright
© Microscopy Society of America 2017 

References

[1] Hovington, P., etal, Scanning Vol. 38 Nov/Dec 2016). pp. 571–578.Google Scholar
[2] Stevie, F. A., et al Surface and Interface Analysis, SIMS proceedings paper, 2014.Google Scholar
[3] Stevie, F.A. Secondary ion mass spectrometry: Applications for depth profiling and surface characterization. New York: Momentum Press 2016.Google Scholar
[4] Wilson, R.G., Stevie, F.A. & Magee, C.W. Secondary ion mass spectrometry. 1.6–10 New York: Wiley 1989.Google Scholar