Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-02T20:51:43.794Z Has data issue: false hasContentIssue false
  • English
  • Français

Towards Li Quantification at High Spatial Resolution Using EDS

Published online by Cambridge University Press:  25 July 2016

P. Hovington ,
V. Timoshevskii ,
S. Burgess ,
P. Statham ,
H. Demers ,
R. Gauvin  and
K. Zaghib
P. Hovington
Affiliation:
Hydro-Quebec Reaserch Institute, Varennes, Quebec, Canada
V. Timoshevskii
Affiliation:
Hydro-Quebec Reaserch Institute, Varennes, Quebec, Canada
S. Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High WycombeUK
P. Statham
Affiliation:
Oxford Instruments NanoAnalysis, High WycombeUK
H. Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
R. Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
K. Zaghib
Affiliation:
Hydro-Quebec Reaserch Institute, Varennes, Quebec, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 84 - 85
Copyright
© Microscopy Society of America 2016 

References

[1] Hovington, P., et al, Scanning 2016, in press.Google Scholar
[2] Terauchi, M., et al, Journal of Electron Microscopy 61(1 (2012). p. 1.Google Scholar