17 results
Reasons to Replace a Proportional Counter (PC) in the Wavelength Dispersive Spectrometer (WDS) with a Silicon Drift Detector (SDD)
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 768-771
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- August 2020
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FEGSEM X-Ray Mapping System with Multiple SDDs for Quantitative X-Ray Mapping and Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 64-66
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- August 2020
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SD-WDS: Bremsstrahlung Determination by Theoretical Calculation and Subsequent Estimation of Mass Attenuation Coefficients
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2316-2317
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- August 2019
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Understanding your Material Better – Low Voltage Imaging, Analysis and X-ray Mapping - Applications and Points to Consider
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 470-471
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- August 2019
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Next Generation of Instruments Required - Not just X-Ray Imaging but Combined EDS, CL, GSR, XRM, XRD and Raman Systems
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 996-997
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- August 2018
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SD-WDS Second Order Bremsstrahlung and Peak to Background Ratios
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 756-757
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- August 2018
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Incorporation of an Amptek Silicon Drift Detector into a Wavelength Dispersive Spectrometer (WDS) Replacing the Gas Flow Proportional Counter
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1048-1049
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- July 2017
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Current State of Combined EDS-WDS Quantitative X-Ray Mapping
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 92-93
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- July 2016
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X-ray Mapping Characterisation of Materials that have a Large Dynamic Compositional Range
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 114-115
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- July 2016
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Conditions for Low Voltage Microanalysis and X-ray Mapping
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 406-407
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- July 2016
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Dedicated X-Ray mapping system with single and multiple SDD detectors for quantitative X-Ray mapping and data processing
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2191-2192
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- August 2015
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X-Ray Mapping Investigations of Salt Migration in Seeds through use of Window and Windowless Silicon Drift Detectors
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 634-635
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- August 2014
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X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-Al Roll Bonded Laminate with an Annular Silicon Drift Detector
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 676-677
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- August 2014
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Contributors
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- Book:
- An Introduction to Clinical Emergency Medicine
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- 05 May 2012
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- 10 April 2012, pp xi-xvi
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X-Ray Mapping and Scatter Diagram Analysis of the Discoloring Products Resulting from the Interaction of Artist's Pigments
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- Microscopy and Microanalysis / Volume 16 / Issue 5 / October 2010
- Published online by Cambridge University Press:
- 31 August 2010, pp. 594-598
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- October 2010
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SMA imaging of the masers in MWC349A
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- Proceedings of the International Astronomical Union / Volume 3 / Issue S242 / March 2007
- Published online by Cambridge University Press:
- 01 March 2007, pp. 494-495
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- March 2007
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X-Ray Mapping and Electron Back-Scattered Diffraction of Phases in Welded Materials
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 916-917
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- August 2004
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