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Next Generation of Instruments Required - Not just X-Ray Imaging but Combined EDS, CL, GSR, XRM, XRD and Raman Systems

Published online by Cambridge University Press:  01 August 2018

Richard Wuhrer ,
Ken Mason  and
Ken Moran
Richard Wuhrer
Affiliation:
Western Sydney University Advanced Materials Characterisation Facility, NSW, Australia.
Ken Mason
Affiliation:
Eastern Analytical sprl, Szoce, Hungary.
Ken Moran
Affiliation:
Moran Scientific Pty. Ltd, Bungonia, NSW, Australia.

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 996 - 997
Copyright
© Microscopy Society of America 2018 

References

[1] Mason, K. A Forensic Mineralogy Toolbox - the next generation of instrumentation for forensic applications. International Microscopy Congress IMC 2014 Prague.Google Scholar
[2] Wuhrer, R. Mason, K. "Introduction to Gunshot residue Analysis and Recent Advances", Book of Tutorials and Abstracts, Electron Probe Microanalysis of Materials Today, EMAS 2016 p241.Google Scholar
[3] Wuhrer, R. Moran, K. "Quantitative X-ray mapping, scatter diagrams and the generation of correction maps to obtain more information about your material". IOP Conference Series: Materials Science and Engineering Volume 55(Issue 1 2014.Google Scholar