Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-29T21:44:06.354Z Has data issue: false hasContentIssue false
  • English
  • Français

Dedicated X-Ray mapping system with single and multiple SDD detectors for quantitative X-Ray mapping and data processing

Published online by Cambridge University Press:  23 September 2015

Richard Wuhrer  and
Ken Moran
Richard Wuhrer
Affiliation:
University of Western Sydney, Advanced Materials Characterisation Facility (AMCF), Australia
Ken Moran
Affiliation:
Moran Scientific Pty Ltd, 4850 Oallen Ford Road, Bungonia, NSW, 2580, Australia

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2191 - 2192
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Moran, K. and Wuhrer, R., "Quantitative Bulk and Trace Element X-Ray Mapping Using Multiple Detectors. Mikrochimica Acta Vol. 155, pp. 59–66 (2006).Google Scholar
[2] Moran, K. and Wuhrer, R. "X-ray mapping and interpretation of scatter diagrams. Mikrochimica Vol. 155, pp. 209–217 (2006).Google Scholar
[3] Wuhrer, R., Moran, K. and Phillips, M. R., "Multi-detector X-Ray mapping and generation of correction factor images for problem solving. Microscopy and Microanalysis 14 (No 2), 1108CD-1109CD 2008.CrossRefGoogle Scholar
[4] Wuhrer, R., Moran, K. and Phillips, M. R., "X-Ray mapping and post processing. Microscopy and Microanalysis 12 (No 2), 1404CD-1405CD (2006).Google Scholar