Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-28T04:58:59.774Z Has data issue: false hasContentIssue false

Current State of Combined EDS-WDS Quantitative X-Ray Mapping

Published online by Cambridge University Press:  25 July 2016

Ken Moran
Affiliation:
Moran Scientific Pty Ltd, 4850 Oallen Ford Road, Bungonia, NSW, 2580, Australia
Richard Wuhrer
Affiliation:
Western Sydney University, Advanced Materials Characterisation Facility (AMCF), Australia

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[1] Moran, K. & Wuhrer, R. “Quantitative Bulk and Trace Element X-Ray Mapping Using Multiple Detectors”. Mikrochimica Acta Vol. 155, pp. 5966, 2006.Google Scholar
[2] Wuhrer, R. & Moran, K. “Dedicated X-Ray Mapping System with Single and Multiple SDD Detectors for Quantitative X-Ray Mapping and Data Processing-ray Mapping and Chemical Phase Mapping with an Amptek SDD”,. Microsc. Microanal 21(Suppl 3 (2015) p21912192.Google Scholar