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Current State of Combined EDS-WDS Quantitative X-Ray Mapping

Published online by Cambridge University Press:  25 July 2016

Ken Moran
Affiliation:
Moran Scientific Pty Ltd, 4850 Oallen Ford Road, Bungonia, NSW, 2580, Australia
Richard Wuhrer
Affiliation:
Western Sydney University, Advanced Materials Characterisation Facility (AMCF), Australia

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[1] Moran, K. & Wuhrer, R. “Quantitative Bulk and Trace Element X-Ray Mapping Using Multiple Detectors”. Mikrochimica Acta Vol. 155, pp. 5966, 2006.Google Scholar
[2] Wuhrer, R. & Moran, K. “Dedicated X-Ray Mapping System with Single and Multiple SDD Detectors for Quantitative X-Ray Mapping and Data Processing-ray Mapping and Chemical Phase Mapping with an Amptek SDD”,. Microsc. Microanal 21(Suppl 3 (2015) p21912192.Google Scholar