7 results
Microstructure Evolution of Al-1.5% Cu Alloy as a Function of Resistance Change Due to Isothermal DC Stressing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 516 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 109
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- January 1998
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Effect of Poly-Si on Electromigration Behaviors and Microstructure Characteristics of Au Metallization
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- Journal:
- MRS Online Proceedings Library Archive / Volume 516 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 299
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- January 1998
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Oxygen Implanted Layers in Silicon Electrical and Microstructural Characterization
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- Journal:
- MRS Online Proceedings Library Archive / Volume 45 / 1985
- Published online by Cambridge University Press:
- 25 February 2011, 129
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- 1985
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Deep Levels Associated with Oxygen Precipitation in CZ Silicon and Correlation with Minority Carrier Lifetimes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 46 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 281
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- 1985
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Transient Annealing of Boron Implanted Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 23 / 1983
- Published online by Cambridge University Press:
- 22 February 2011, 279
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- 1983
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Oxygen Precipitation in Silicon - Its Effects on Minority Carrier Recombination and Generation Lifetime
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- Journal:
- MRS Online Proceedings Library Archive / Volume 14 / 1982
- Published online by Cambridge University Press:
- 15 February 2011, 187
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- 1982
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Structural and Chemical Microanalysis of Oxygen-Bearing Precipitates in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 14 / 1982
- Published online by Cambridge University Press:
- 15 February 2011, 195
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- 1982
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