24 results
Application of Bremsstrahlung Background Calculation and Automated Element Identification to TEM EDS Spectra
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 825-826
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- August 2015
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Performance of an Improved TEM SDD Detector
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 608-609
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- August 2014
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A Comparison of Cross Section Formulas and their Effect on Calculated k-factors
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 612-613
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- August 2014
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The Development of A Large-Area Windowless Energy Dispersive X-ray Detector for STEM-EDX Analysis
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1192-1193
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- August 2013
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The Real World Practical Issues and Limitations of Silicon Drift Detectors on Electron Microscopes
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1266-1267
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- August 2013
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Windowless Silicon Drift Detectors
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 620-621
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- July 2011
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The Reduction of Pileup Effects in Spectra Collected with Silicon Drift Detectors
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1260-1261
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- August 2008
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X-Ray Mapping of Rough Surfaces with Multiple Silicon Drift Detectors
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1102-1103
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- August 2008
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Analysis of Oxide Thin Specimens at 30 and 200 Kv with the Ionic Compound Method
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1452-1453
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- August 2007
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Fast X-ray Mapping with Excellent Light Element Performance from an SDD
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1370-1371
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- August 2007
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Attaining High Count Rates and X-Ray Mapping for the SDD
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1362-1363
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- August 2007
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Parallel Beam Wavelength X-Ray Spectroscopy: An Evaluation of Current Performance
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 468-469
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- August 2005
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The Right Tool For Low Energy X-Ray Microanalysis
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 15 July 2003, pp. 896-897
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- August 2003
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The Optimization of EDX Performance in Tecnai TEMs
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1612-1613
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- August 2002
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Standardless EDS Quantitative Analysis at High Tilt Angles
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1468-1469
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- August 2002
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New Automated Analytical Integration for TEM Operation
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 870-871
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- August 2001
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Observing the Chemical State of Elements With Z=21 To 28 From L Alpha1 To L L Ratios With Energy Dispersive Spectroscopy (EDS)
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 590-591
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- August 1999
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X-Ray Analysis of Materials: Avoiding the Pits and Other Practical Hints
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- Microscopy Today / Volume 2 / Issue 8 / November 1994
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- 14 March 2018, pp. 8-9
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- November 1994
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Measurement of Composition and Thickness for Single Layer Coating with Energy Dispersive XRF Analysis
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- Advances in X-ray Analysis / Volume 26 / 1982
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- 06 March 2019, pp. 431-436
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- 1982
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Modified NRLXRF Program for Energy Dispersive X-Ray Fluorescence Analysis
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- Advances in X-ray Analysis / Volume 23 / 1979
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- 06 March 2019, pp. 99-110
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- 1979
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